X9271_14 Datasheet, PDF (12/18 Pages) Intersil Corporation – Single, Digitally Controlled Potentiometer

X9271
D.C. Operating Characteristics Across the recommended operating conditions unless otherwise specified.
LIMITS
SYMBOL
PARAMETER
MIN
MAX
(Note 17) TYP (Note 17) UNITS
TEST CONDITIONS
I_CC1
I_CC2
I_SB
I_LI
I_LO
V_IH
V_IL
V_OL
V_OH
V_OH
V_CC Supply Current
(Active)
V_CC Supply Current
(Nonvolatile Write)
V_CC Current (Standby)
Input Leakage Current
Output Leakage Current
Input HIGH Voltage
Input LOW Voltage
Output LOW Voltage
Output HIGH Voltage
Output HIGH Voltage
400
µA f_SCK = 2.5MHz, SO = Open, V_CC = 6V
Other Inputs = V_SS
1
5
mA f_SCK = 2.5MHz, SO = Open, V_CC = 6V
Other Inputs = V_SS
3
µA SCK = SI = V_SS, Addr. = V_SS,
CS = V_CC = 6V
10
µA V_IN = V_SS to V_CC
10
µA V_OUT = V_SS to V_CC
V_CC x 0.7
V_CC + 1
V
-1
V_CC x 0.3
V
0.4
V I_OL = 3mA
V_CC - 0.8
V I_OH = -1mA, V_CC  +3V
V_CC - 0.4
V I_OH = -0.4mA, V_CC  +3V
Endurance and Data Retention
PARAMETER
Minimum Endurance
Data Retention
MIN.
(Note 17)
100,000
100
UNITS
Data changes per bit per register
Years
Capacitance
SYMBOL
C_IN/OUT (Note 15)
C_OUT (Note 15)
C_IN (Note 15)
TEST
Input / Output Capacitance (SI)
Output Capacitance (SO)
Input Capacitance (A0, CS, WP, HOLD, and SCK)
MAX.
(Note 17)
8
8
6
UNITS
pF
pF
pF
TEST CONDITIONS
V_OUT = 0V
V_OUT = 0V
V_IN = 0V
Power-Up Timing
SYMBOL
t_r V_CC (Note 15)
t_PUR (Note 16)
t_PUW (Note 16)
PARAMETER
V_CC Power-up Rate
Power-up to Initiation of Read Operation
Power-up to Initiation of Write Operation
MIN.
(Note 17)
0.2
MAX.
(Note 17)
50
1
50
UNITS
V/ms
ms
ms
A.C. Test Conditions
INPUT PULSE LEVELS
Input Rise and Fall Times
V_CC x 0.1 to V_CC x 0.9
10ns
Input and Output Timing Level
V_CC x 0.5
NOTES:
15. This parameter is not 100% tested.
16. t_PUR and t_PUW are the delays required from the time the (last) power supply (V_CC-) is stable until the specific instruction can be issued. These
parameters are periodically sampled and are not 100% tested.
17. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
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FN8174.4
July 18, 2014