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X9119 Datasheet, PDF (12/18 Pages) Xilinx, Inc – Single Digitally-Controlled (XDCP ™ ) Potentiometer
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X9119
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions unless otherwise specified.)
Symbol
Parameter
Min.
Limits
Typ. Max.
Units
Test Conditions
ICC1 VCC supply current
(active)
ICC2 VCC supply current
(nonvolatile write)
ISB VCC current (standby)
ILI
ILO
VIH
VIL
VOL
VOH
Input leakage current
Output leakage
current
Input HIGH voltage
Input LOW voltage
Output LOW voltage
Output HIGH voltage
VCC x 0.7
-1
3
mA fSCL = 400kHz; VCC = +5.5V;
SDA = Open; (for 2-wire, Active, Read and
Volatile Write States only)
5
mA fSCL = 400kHz; VCC = +5.5V;
SDA = Open; (for 2-wire, Active,
Non-volatile Write State only)
3
µA VCC = +5.5V; VIN = VSS or VCC;
SDA = VCC;
(for 2-wire, Standby State only)
10
µA VIN = VSS to VCC
10
µA VOUT = VSS to VCC
VCC + 1 V
VCC x 0.3 V
0.4
V IOL = 3mA
ENDURANCE AND DATA RETENTION
Parameter
Minimum Endurance
Data Retention
Min.
100,000
100
Units
Data changes per bit per register
years
CAPACITANCE
Symbol
CIN/OUT(6)
CIN(6)
Test
Input/Output capacitance (SI)
Input capacitance (SCL, WP, A1 and A0)
Max.
8
6
Units
pF
pF
Test Conditions
VOUT = 0V
VIN = 0V
POWER-UP TIMING
Symbol
Parameter
Min.
Max.
Units
tr VCC(6)
VCC Power-up Rate
0.2
tPUR(7)
Power-up to Initiation of read operation
tPUW(7)
Power-up to Initiation of write operation
50
V/ms
1
ms
50
ms
Notes: (6) This parameter is not 100% tested.
(7) tPUR and tPUW are the delays required from the time the (last) power supply (Vcc-) is stable until the specific instruction can be issued.
These parameters are not 100% tested.
(8) This is not a tested or guaranteed parameter and should be used only as a guideline.
12
FN8162.2
September 15, 2005
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