ISL70617SEH Datasheet, PDF (10/28 Pages) Intersil Corporation – High voltage process control

ISL70617SEH
Typical Post Radiation Performance Curves V_CC = V_CO = 18V, V_EE= V_EO = -18V, V_CM = 0V, R_L = Open,
unless otherwise specified. Error bars (if shown) are based on minimum and maximum data. (Continued)
4000
250
3000
2000 ±18V SUPPLIES
1000
200
150 ±18V SUPPLIES
100
50
0
0
-1000
-2000
-3000
V_OSFB 18V, BIASED
V_osFB 18V, GROUNDED
SPEC LIMIT
SPEC LIMIT
-4000
0
25
50
75
ANNEAL
TOTAL DOSE (krad(Si) AT 0.01rad(Si)/s)
-50
-100
-150
-200
I_BFB 18V, BIASED
I_BFB 18V, GROUNDED
SPEC LIMIT
SPEC LIMIT
-250
0
25
50
75
ANNEAL
TOTAL DOSE (krad(Si) AT 0.01rad(Si)/s)
FIGURE 9. V_OSFB vs TOTAL DOSE
FIGURE 10. I_BFB vs TOTAL DOSE
0.03
±18V SUPPLIES
0.02
0.01
Eg120k, 18V , BIASED
Eg120k, 18V , GROUNDED
SPEC LIMIT
SPEC LIMIT
0
-0.01
-0.02
-0.03
0
25
50
75
ANNEAL
TOTAL DOSE (krad(Si) AT 0.01rad(Si)/s)
FIGURE 11. GAIN ERROR (GAIN = 1) vs TOTAL DOSE
0.06
±18V SUPPLIES
0.04
0.02
0
Eg100, 18V , BIASED
Eg100, 18V , GROUNDED
SPEC LIMIT
SPEC LIMIT
-0.02
-0.04
-0.06
0
25
50
75
ANNEAL
TOTAL DOSE (krad(Si) AT 0.01rad(Si)/s)
FIGURE 12. GAIN ERROR (GAIN = 100) vs TOTAL DOSE
0.06
±18V SUPPLIES
0.04
0.02
0
-0.02
-0.04
Eg30k , 18V, BIASED
Eg30k , 18V, GROUNDED
SPEC LIMIT
SPEC LIMIT
-0.06
0
25
50
75
ANNEAL
TOTAL DOSE (krad(Si) AT 0.01rad(Si)/s)
FIGURE 13. GAIN ERROR (GAIN = 1) vs TOTAL DOSE
15
± 18V SUPPLIES
10 ^{RFB = 30.1k}
5
0
-5
V_OSOUT 30k, BIASED
V_OSOUT 30k, GROUNDED
-10
SPEC LIMIT
SPEC LIMIT
-15 ₀
25
50
75
ANNEAL
TOTAL DOSE (krad(Si) AT 0.01rad(Si)/s)
FIGURE 14. V_OSOUT (GAIN = 1) vs TOTAL DOSE
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FN8697.4
December 16, 2016