ICB2FL02G Datasheet, PDF (36/55 Pages) Infineon Technologies AG – Smart Ballast Control IC for Fluorescent Lamp Ballasts

2^nd Generation FL-Controller for FL-Ballasts
Functional Description
2.8.3 Built in Customer Test Mode (Clock Acceleration)
The built in customer test mode, supported by this IC, saves testing time for customers in terms of
ballast end test. In that mode, the IC accelerates the internal clock in order to reduce the time of the 4
different procedures by the following factors (see Table 1).
Phase
Preheating
Time Out Ignition
Pre Run Mode
EOL2
Duration for Test [ms]
625
118.5
41.7
41,7
Acceleration Factor
4
2
15
60
Nominal Duration [ms]
2500 (max)
237
625
2500
Table 1 Specified Acceleration Factors
2.8.3.1
Enabling of the Clock Acceleration
The clock acceleration (Built in Customer Test Mode) is activated when the chip supply voltage
exceeds V_CC > 14.1V and the voltages at the Run Frequency and Preheating Frequency pin are set to
V_RFRUN = V_RFPH = 5.0 V (± 5 %) see Figure 34 Clock Acceleration (Built in Customer Test Mode). A
RES pin voltage of V_RES > 3.5 V up to 5.0 V (± 5 %) prevents a power up of the IC, the IC remains in a
mode before powering up. This status is hold as long as the voltage at the RES pin is at V_RES > 3.5 V
up to 5.0 V (± 5 %) – no power up. Note: after the activation of the clock acceleration mode, the
voltage level of 5.0V at the Run Frequency and Preheating Frequency pin (V_RFRUN = V_RFPH) can be
released.
2.8.3.2
Starting the Chip with accelerated Clock
In order to start the IC with an accelerated clock, set the voltage at the RES pin to GND (V_RES = 0 V).
Figure 34 Clock Acceleration (Built in Customer Test Mode). The IC powers up the system and starts
working with an accelerated clock. Now the duration of the different modes are accelerated by Factors
shown in Table 1.
Figure 34 Clock Acceleration (Built in Customer Test Mode)
Preliminary Datasheet
Page 36 of 55
ICB2FL02G
V1.2