TLE4926C-HTNE6747 Datasheet, PDF (24/27 Pages) Infineon Technologies AG – Dynamic Differential Hall Effect Sensor

∆ϕ _d
=
360°• n
60
• ∆t_d
TLE4926C-HTN E6747
∆ϕ_d ... systematic phase error due to the variation of the delay time over temperature in °
n
… speed of the camshaft wheel in min^-1
∆t_d … variation of delay time over temperature in sec
B
Bdiff_max
Bdiff_typ
1σ
3σ
Noise
Jitter (Repeatability)
The phase jitter is normally caused by the
analogue system noise. If there is an update of
the offset-DAC due to the algorithm, what could
∂B
happen after each tooth, then an additional step
∂ϕ
in the phase occurs (see description of the
algorithm). This is not included in the following
calculations. The noise is transformed through the
slope of the magnetic edge into a phase error.
The phase jitter is determined by the two
formulas:
Figure17: Phase-Jitter
ϕ
Phase-Jitter
( ) ϕ_{Jitter_typ}
= ^∂ϕ •
∂B
B_{neff _ typ}
ϕ_{Jitter_typ}
ϕ_{Jitter_max}
∂ϕ
∂B
B_{neff_typ}
B_{neff_max}
( ) ϕ_{Jitter_ max}
=
∂ϕ _•
∂B
B_{neff _ max}
...
typical phase jitter at Tj=25°C in ° (1Sigma)
...
maximum phase jitter at Tj=175°C in ° (3Sigma)
...
inverse of the magnetic slope of the edge in °/T
...
typical value of B_diff in T (1σ-value at Tj=25°C)
...
maximum value of B_diff in T (3σ-value at Tj=175°C)
Data Sheet
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