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1EDI20N12AF_15 Datasheet, PDF (17/22 Pages) Infineon Technologies AG – Single Channel MOSFET and GaN HEMT Gate Driver IC
5.3.4 Short Circuit Clamping
1EDI EiceDRIVER™ Compact
1EDI20N12AF
Electrical Parameters
Table 7 Short Circuit Clamping
Parameter
Symbol
Min.
Clamping voltage (OUT+) VCLPout
–
(VOUT - VVCC2)
Values
Unit
Typ.
Max.
0.9
1.3
V
5.3.5 Dynamic Characteristics
Dynamic characteristics are measured with VVCC1 = 5 V and VVCC2 = 15 V.
Table 8 Dynamic Characteristics
Parameter
Symbol
Min.
Input IN to output propa- TPDON
90
gation delay ON
Input IN to output propa- TPDOFF
100
gation delay OFF
Input IN to output propa- TPDISTO -15
gation delay distortion
(TPDOFF - TPDON)
Input pulse suppression TMININ+, 30
IN+, IN-
TMININ-
IN input to output
TPDONt
–
propagation delay ON
variation due to temp
IN input to output
TPDOFFt
–
propagation delay OFF
variation due to temp
IN input to output
propagation delay
TPDISTOt
–
distortion variation due to
temp (TPDOFF-TPDON)
Rise time
TRISE
5
Values
Unit
Typ.
Max.
115
137
ns
120
143
ns
5
25
ns
40
–
ns
–
10
ns
–
10
ns
–
4
ns
10
20
ns
Fall time
TFALL
4
9
19
ns
1) The parameter is not subject to production test - verified by design/characterization
Note /
Test Condition
IN+ = High,
IN- = Low,
OUT = High
IOUT = 500 mA
pulse test,
tCLPmax = 10 μs)
Note /
Test Condition
CLOAD = 100 pF
VIN+ = 50%,
VOUT=50% @ 25°C
–
1)CLOAD = 100 pF
VIN+ = 50%,
VOUT=50%
1)CLOAD = 100 pF
VIN+ = 50%,
VOUT=50%
1)CLOAD = 100 pF
VIN+ = 50%,
VOUT=50%
CLOAD = 1 nF
VL 20%, VH 80%
CLOAD = 1 nF
VL 20%, VH 80%
Data Sheet
17
Rev. 2.0, 2015-06-01