ICS87972I Datasheet, PDF (7/17 Pages) Integrated Circuit Systems – LOW SKEW, 1-TO-12 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER

ICS87972I
LOW SKEW, 1-TO-12
LVCMOS/LVTTL CLOCK MULTIPLIER/ZERO DELAY BUFFER
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V_DD
Inputs, V_I
Outputs, V
O
Package Thermal Impedance, θ_JA
Storage Temperature, T_STG
4.6V
-0.5V to V_DD + 0.5 V
-0.5V to V + 0.5V
DDO
42.3°C/W (0 lfpm)
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the DC Characteristics or AC Character-
istics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS,
V
DD
=
V
DDA
=
V
DDO
=
3.3V±5%,
TA
=
-40°C
TO
85°C
Symbol Parameter
Test Conditions
Minimum Typical
V_DD
Core Supply Voltage
V_DDA
Analog Supply Voltage
V_DDO
Output Supply Voltage
I_DD
Power Supply Current
All power pins
I_DDA
Analog Supply Current
NOTE: Special thermal handling may be required in some configurations.
3.135
3.3
2.935
3.3
3.135
3.3
Maximum
3.465
3.465
3.465
250
20
Units
V
V
V
mA
mA
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, V_DD = V_DDA = V_DDO = 3.3V±5%, TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum
V_IH
Input High Voltage
V_IL
Input Low Voltage
I_IN
Input Current
V_OH
Output High Voltage
V_OL
Output Low Voltage
I_OH = -20mA
I_OL = 20mA
2
3.6
0.8
±120
2.4
0.5
Units
V
V
µA
V
V
TABLE 5. INPUT FREQUENCY CHARACTERISTICS, V_DD = V_DDA = V_DDO = 3.3V±5%, TA = -40°C TO 85°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum Units
CLK0, CLK1; NOTE 1
120
MHz
f_IN
Input Frequency XTAL1, XTAL2
FRZ_CLK
10
25
MHz
20
MHz
NOTE 1: Input frequency depends on the feedback divide ratio to ensure "clock * feedback divide" is in the VCO range of
200MHz to 480MHz.
87972DYI
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REV. E JUNE 25, 2010