ICS950402 Datasheet, PDF (15/19 Pages) Integrated Circuit Systems – AMD - K8 System Clock Chip

ICS950402
Electrical Characteristics - PCICLK, PCICK33 / HT66 (33MHz)
T_A = 0 - 70°C; V_DD = 3.3V +/-5%; C_L = 30 pF (unless otherwise specified)
PARAMETER
SYMBOL
CONDITIONS
Output High Voltage
Output Low Voltage
Output High Current
Output Low Current
Rise Edge Rate¹
V_OH1
V_OL1
I_OH1
I_OL1
t_r1
I_OH = -12 mA
I_OL = 9.0 mA
V_OH = 2.0 V
V_OL = 0.8 V
Measured from 20 - 60%, 1X drive strength
2X drive strength
2.3X drive strength
Fall Edge Rate¹
Duty Cycle¹
Jitter, Cycle-to-Cycle¹
Jitter, Accumulated¹
t_f1
d_t1
t_cyc-cyc1
Measured from 60 - 20%, 1X drive strength
2X drive strength
2.3X drive strength
V_T = 1.5 V
Measured on rising edge @ 1.5V
Output Impedance
Z_O
V_O = V_X
1_{Guaranteed by design, not 100% tested in production.}
MIN
2.4
10
0.9
1
1
45
-1000
TYP
0.92
1.38
1.63
1.15
1.93
2.19
51
140
450
265
MAX
0.4
-15
UNITS
V
V
mA
mA
4 V/ns
4 V/ns
55
%
250 ps
1000 ps
500 ps
Electrical Characteristics - PCICK33 / HT66 (66MHz)
T_A = 0 - 70°C; V_DD = 3.3V +/-5%; C_L = 30 pF (unless otherwise specified)
PARAMETER
SYMBOL
CONDITIONS
Output High Voltage
Output Low Voltage
Output High Current
Output Low Current
Rise Edge Rate¹
V_OH1
V_OL1
I_OH1
I_OL1
t_r1
I_OH = -12 mA
I_OL = 9.0 mA
V_OH = 2.0 V
V_OL = 0.8 V
Measured from 20 - 60%, 1X drive strength
2.3X drive strength
Fall Edge Rate¹
t_f1
Measured from 60 - 20%, 1X drive strength
2.3X drive strength
Duty Cycle¹
Jitter, Cycle-to-Cycle¹
Jitter, Accumulated¹
d_t1
t_cyc-cyc1
V_T = 1.5 V
Measured on rising edge @ 1.5V
Output Impedance
Z_O
V_O = V_X
1_{Guaranteed by design, not 100% tested in production.}
MIN TYP
2.4
10
0.9 0.95
1 1.65
1
1.18
2.12
45
51
200
-1000 450
265
MAX
0.4
-15
UNITS
V
V
mA
mA
4 V/ns
4
55
250
1000
500
V/ns
%
ps
ps
ps
0700B—04/30/04
15