HY29F800 Datasheet, PDF (24/40 Pages) Hynix Semiconductor – 8 Megabit (1Mx8/512Kx16), 5 Volt-only, Flash Memory

HY29F800
AC CHARACTERISTICS
Read Operations
Parameter
JEDEC Std
Description
t_AVAV
t_RC Read Cycle Time ¹
t_AVQV
t_ACC Address to Output Delay
t_ELQV
t_EHQZ
t_GLQV
t_GHQZ
t_CE Chip Enable to Output Delay
t_DF Chip Enable to Output High Z ¹
t_OE Output Enable to Output Delay
t_DF Output Enable to Output High Z ¹
t_OEH
Output Enable
Hold Time ¹
Read
Toggle and
Data# Polling
t_AXQX
t_OH
Output Hold Time from Addresses, CE#
or OE#, Whichever Occurs First ¹
Notes:
1. Not 100% tested.
2. See Figure 11 and Table 7 for test conditions.
Test Setup
Speed Option
Unit
- 55 - 70 - 90 - 12
Min 55 70 90 120 ns
CE# = V_IL
OE# = V_IL
Max
55
70
OE# = V_IL Max 55 70
Max 20 20
90 120 ns
90 120 ns
20 30 ns
CE# = V_IL Max 30 30 35 50 ns
Max 20 20 20 30 ns
Min
0
ns
Min
10
ns
Min
0
ns
Addresses
CE#
t_RC
Addresses Stable
t_ACC
OE#
WE#
Outputs
t_OE
t_OEH
t_DF
t_CE
t_OH
Output Valid
RESET#
RY/BY#
0V
24
Figure 13. Read Operation Timings
Rev. 4.2/May 01