HN27C4000G Datasheet, PDF (6/20 Pages) Hitachi Semiconductor – 524288-Word ®8-Bit/262144-Word X 16-Bit CMOS UV Erasable and Programmable ROM

HN27C4000G Series
AC Characteristics (V_CC = 5 V ± 10%, V_PP = V_SS to V_CC, Ta = 0 to +70°C)
Test Conditions
• Input pulse levels: 0.45 to 2.4 V
• Input rise and fall times: ≤ 10 ns
• Output load: 1 TTL gate +100 pF
• Reference levels for measuring timing: 0.8 V, 2.0 V
HN27C4000 HN27C4000 HN27C4000
-10
-12
-15
Item
Symbol Min Max Min Max Min Max Unit Test conditions
Address to output delay t_ACC
CE to output delay
t_CE
OE to output delay
t_OE
Burst address to
t_BAC
output delay
— 100 — 120 — 150 ns CE = OE = V_IL
— 100 — 120 — 150 ns OE = V_IL
— 60 — 60 — 70 ns CE = V_IL
— 50 — 60 — 60 ns CE = V_IL
OE high to output float ^*1 t_DF
Address to output hold
t_OH
0
35 0
40 0
50 ns CE = V_IL
5
—5
—5
— ns CE = OE = V_IL
Note: 1. t_DF is defined as the time at which the output achieves the open circuit condition and data is no
longer driven.
Read Timing Waveform
Address
CE Standby mode
OE
Data Out
Active mode
t_CE
Standby mode
t_OE
t _ACC
t_DF
t_OH
Data Out Valid
6