HN27C4000G Datasheet, PDF (5/20 Pages) Hitachi Semiconductor – 524288-Word ®8-Bit/262144-Word X 16-Bit CMOS UV Erasable and Programmable ROM

HN27C4000G Series
Capacitance (Ta = 25°C, f = 1 MHz)
Item
Input capacitance
Output capacitance
Symbol Min Typ
Cin
—
—
Cout
—
—
Max Unit Test conditions Notes
12
pF
Vin = 0 V
Except BYTE/V_PP
20
pF
Vout = 0 V
Read Operation
DC Characteristics (V_CC = 5 V ± 10%, V_PP = V_SS to V_CC, Ta = 0 to +70°C)
Item
Symbol Min Typ Max Unit Test conditions
Input leakage current I_LI
Output leakage current I_LO
V_PP current
I_PP1
Standby V_CC current
I_SB1
I_SB2
Operating V_CC current I_CC1
I_CC2
Input voltage
V_IL
V_IH
—
—
—
—
—
1
—
—
—
1
—
—
—
—
–0.3^*1 —
2.2 —
2
µA
2
µA
20
µA
1
mA
20
µA
35
mA
120 mA
0.8 V
V_CC V
+ 1^*2
Vin = 5.5 V
Vout = 5.5 V/0.45 V
V_PP = 5.5 V
CE = V_IH
CE = V_CC ± 0.3 V
Iout = 0 mA, f = 1 MHz
Iout = 0 mA, f = 10 MHz
Output voltage
V_OL
—
—
0.45 V
I_OL = 2.1 mA
V_OH
2.4 —
—
V
I_OH = –400 µA
Notes: 1. V_IL min = –1.0 V for pulse width ≤ 50 ns
V_IL min = –2.0 V for pulse width ≤ 20 ns
2. V_IH max = V_CC +1.5 V for pulse width ≤ 20 ns
If V_IH is over the specified maximum value, read operation cannot be guaranteed.
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