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S9S08SG8E2MSC Datasheet, PDF (308/320 Pages) Freescale Semiconductor, Inc – MC9S08SG8 MC9S08SG4 Data Sheet Addendum | |||
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Appendix A Electrical Characteristics
Table A-12. ADC Characteristics (continued)
Temp Rated2
Characteristic
Conditions
C Symb Min Typ1 Max
Unit
Stand
ard
AEC
Grade
0
Comment
Conversion
time (including
sample time)
Sample time
Total
unadjusted
error (Includes
quantization)
Differential
Non-Linearity
Short sample
(ADLSMP=0)
Long sample
(ADLSMP=1)
Short sample
(ADLSMP=0)
Long sample
(ADLSMP=1)
10 bit mode
8 bit mode
10 bit mode
8 bit mode
Integral
non-linearity
10 bit mode
8 bit mode
â 20
â
x
D tADC
ADCK
cycles
â 40
â
x
â
3.5
â
x
D tADS
ADCK
cycles
â 23.5 â
x
â ï±1.5 ï±3.5 LSB2
x
P ETUE
â
ï±0.7 ï±1.5 LSB3
x
â ï±0.5 ï±1.0
x
P DNL
LSB3
â ï±0.3 ï±0.5
x
Monotonicity and No-Missing-Codes guaranteed
â ï±0.5 ï±1.0
x
T INL
LSB3
â ï±0.3 ï±0.5
x
x
See ADC
x
Chapter
for
conversion
x
time
variances
x
x
x
x
x
x
x
Zero-scale
error
10 bit mode
8 bit mode
Full-scale errorï 10 bit mode
(VADIN = VDD) 8 bit mode
â ï±1.5 ï±2.5
x
x
P
EZS
LSB3
â ï±0.5 ï±0.7
x
x
0 ï±1.0 ï±1.5
x
x
T
EFS
LSB3
0 ï±0.5 ï±0.5
x
x
Quantization
error
10 bit mode
8 bit mode
â
â ï±0.5
x
x
D
EQ
LSB3
â
â ï±0.5
x
x
Input leakage
error
Temp sensor
slope
10 bit mode
8 bit mode
â40ï°C to 25ï°C
25ï°C to 125ï°C
0 ï±0.2 ï±2.5
x
D
EIL
LSB3
0 ï±0.1 ï±1
x
D
m
â 3.266 â
x
mV/ï°C
â 3.638 â
x
x
Pad
leakage3 *
x
RAS
x
x
Temp sensor
voltage
25ï°C
D VTEMP â 1.396 â
V
x
x
25
1 Typical values assume VDD = 5.0 V, Temp = 25ï°C, fADCK = 1.0 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2 Electrical characteristics only apply to the temperature rated devices marked with x.
3 Based on input pad leakage current. Refer to pad electricals.
MC9S08SG8 MCU Series Data Sheet, Rev. 7
304
Freescale Semiconductor
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