MC9RS08KA8 Datasheet, PDF (27/40 Pages) Freescale Semiconductor, Inc – MCU Block Diagram

Electrical Characteristics
Parameter
Table 18. Conducted Susceptibility, EFT/B
Symbol
Conditions
f_OSC/f_BUS
Result
Amplitude¹
(Min)
Unit
A
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
V_{CS_EFT}
V_DD = TBD
T_A = 25^°C
package type
TBD
TBD crystal
TBD bus
B
C
D
TBD
TBD
kV
TBD
TBD
1 _{Data based on qualification test results. Not tested in production.}
The susceptibility performance classification is described in Table 19.
Table 19. Susceptibility Performance Classification
Result
A
No failure
Performance Criteria
The MCU performs as designed during and after exposure.
B
Self-recovering The MCU does not perform as designed during exposure. The MCU returns
failure
automatically to normal operation after exposure is removed.
C
Soft failure
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D
Hard failure
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
E
Damage
be returned to proper operation due to physical damage or other permanent
performance degradation.
MC9RS08KA8 Series, Rev. 1
Freescale Semiconductor
Preliminary—Subject to Change Without Notice
27