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33810_11 Datasheet, PDF (12/37 Pages) Freescale Semiconductor, Inc – Automotive Engine Control IC Quad injector driver with Parallel/SPI control
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics
Characteristics noted under conditions of 3.0 V ≤ VDD ≤ 5.5 V, 6.0 V ≤ VPWR ≤ 32 V, -40°C ≤ TC ≤ 125°C, and calibrated
timers, unless otherwise noted. Where applicable, typical values reflect the parameter’s approximate average value with VPWR
= 13 V, TA = 25°C.
Characteristic
Symbol
Min
Typ
Max
Unit
POWER INPUT
Required Low State Duration on VPWR for Under-voltage Detect
VPWR ≤ 0.2 V
tUV
μs
1.0
–
–
Required Low State Duration on VDD for Power On Reset
VDD ≤ 0.2 V
t RESET
1.0
–
μs
–
INJECTOR DRIVERS
Output ON Current Limit Fault Filter Timer (Short to Battery Fault)
tSC
30
60
90
µs
Output ON Open Circuit Fault Filter Timer
t(ON)OC
3.0
7.5
12
ms
Output Retry Timer
tREF
–
10
15
ms
Output OFF Open Circuit Fault Filter Timer
t(OFF)OC
100
400
µs
Output Slew Rate (No faster than 1.5 μs from off to on and on to off)
t SR(RISE)
RLOAD = 14 Ω, VLOAD = 14 V
1.0
5.0
V/μs
10
Output Slew Rate
RLOAD = 14 Ω, VLOAD = 14 V
t SR(FALL)
V/μs
1.0
5.0
10
Propagation Delay (Input Rising Edge OR CS to Output Falling Edge)
tPHL
Input @ 50%VDD to Output voltage 90% of VLOAD
1.0
5.0
µs
Propagation Delay (Input Falling Edge OR CS to Output Rising Edge)
tPLH
Input @ 50%VDD to Output voltage 10% of VLOAD
1.0
5.0
µs
IGNITION & GENERAL PURPOSE GATE DRIVER PARAMETERS
Propagation Delay (GINx Input Rising Edge OR CS to Output Rising Edge)
tPLH
Input @ 50%VDD to Output voltage 10% of VGS(ON)
0.2
1.0
µs
Propagation Delay (Input Falling Edge OR CS to Output Falling Edge)
tPHL
Input @ 50%VDD to Output voltage 90% of VGS(ON)
0.2
1.0
µs
IGNITION PARAMETERS
Open Secondary Fault Timer accuracy (uncalibrated)
-35
–
35
%
Maximum Dwell Timer Accuracy (uncalibrated)
End of Spark Filter Accuracy (uncalibrated)(13)
-35
–
35
%
-35
–
35
%
Notes
13. This parameter is guaranteed by design, however it is not production tested.
33810
12
Analog Integrated Circuit Device Data
Freescale Semiconductor
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