FXLA2203 Datasheet, PDF (8/16 Pages) Fairchild Semiconductor – Dual-Mode, Dual-SIM-Card Level Translator

Test Diagrams
TEST
SIGNAL
V_CC
DUT
C1
R1
Table 1. AC Test Conditions
V_CCO
1.8V± 0.15V
2.5V ± 0.2V
3.3 ± 0.3V
Figure 4. Test Circuit
C1
30pF
30pF
30pF
R1
1MΩ
1MΩ
1MΩ
DATA
IN
t_pxx
DATA
OUT
V_mi
t_pxx
V_CCI
GND
V_mo ^VCCO
Figure 5. Input Edge Rates for RST and CLK
Notes:
20. Input t_R=t_F=2.0ns, 10% to 90% at V_I=2.5V.
21. Input t_R=t_F=2.5ns, 10% to 90% at V_I=2.5V.
V_{O T}
t_r
V_O
90% x _CC
10% x _CC
V_OL
Time
Figure 6. Active Output Rise Time
V _OH
t _fl
V_{O T}
90% x _CC
10% x _CC
V_OL
Time
Figure 7. Active Output Fall Time
t_W
DATA
IN
V_CCI/2
V_CCI/2
Maximum Data Rate, f = 1/t_W
V_CCI
GND
Figure 8. Maximum Data Rate
© 2010 Fairchild Semiconductor Corporation
FXLA2203 • Rev. 1.0.5
8
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