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FOD8318 Datasheet, PDF (8/31 Pages) Fairchild Semiconductor – 2.5 A Output Current, IGBT Drive Optocoupler with Active Miller Clamp, Desaturation Detection, and Isolated Fault Sensing
Switching Characteristics
Apply over all recommended conditions; typical value is measured at VDD1 = 5 V, VDD2 – VSS = 30 V, VE – VSS = 0 V,
TA = 25 °C unless otherwise specified.
Symbol
Parameter
Conditions
Min. Typ. Max. Units Figure
tPHL
Propagation Delay Time to
Logic Low Output(17)
tPLH
Propagation Delay Time to
Logic High Output(18)
Rg = 10 ¾, Cg =
10 nF,
f = 10 kHz,
Duty Cycle = 50 %(16)
300 500
250 500
ns 17, 18,
19, 20,
ns 21, 22,
43, 51
PWD
PDD Skew
tR
tF
tDESAT(90 %)
tDESAT(10 %)
Pulse Width Distortion,
| tPHL – tPLH|(19)
Propagation Delay Difference
Between Any Two Parts or
Channels, ( tPHL – tPLH)(20)
Output Rise Time (10 % – 90 %)
Output Fall Time (90 % – 10 %)
DESAT Sense to 90 % VO
Delay(21)
DESAT Sense to 10 % VO
Delay(21)
Rg = 10 ¾, Cg =
10 nF,
VDD2 – VSS = 30 V
50 300 ns
–350
350 ns
34
34
850
2
3
ns 43, 53
ns
ns 23, 44
µs 24, 26,
27, 44
tDESAT(FAULT) DESAT Sense to Low Level FAULT
Signal Delay(22)
1.8
5
µs 25, 44,
54
tDESAT(LOW) DESAT Sense to DESAT Low
Propagation Delay(23)
850
ns
44
tRESET(FAULT) RESET to High Level FAULT
Signal Delay(24)
3
6
20 µs 28, 45,
54
PWRESET
tUVLO ON
tUVLO OFF
tGP
RESET Signal Pulse Width
UVLO Turn On Delay(25)
UVLO Turn Off Delay(26)
Time to Good Power(27)
VDD2 = 20 V in
1.0ms Ramp
VDD2 = 0 to 30 V in
10 µs Ramp
1.2
4
3
30
µs
µs 29, 46
µs
µs 30, 31,
46
| CMH |
Common Mode Transient
Immunity at Output High
| CML |
Common Mode Transient
Immunity at Output Low
TA = 25 ºC, VDD1 = 5 V, 35
50
VDD2 = 25 V,
VSS = Ground,
VCM = 1500 Vpeak(28)
TA = 25 ºC, VDD1 = 5 V, 35
50
VDD2 = 25 V,
VSS = Ground,
VCM = 1500 Vpeak(29)
kV/µs 48, 49
kV/µs 47, 50
Notes:
16. This load condition approximates the gate load of a 1200 V / 150 A IGBT.
17. tPHL propagation delay is measured from the 50 % level on the falling edge of the input pulse (VIN+, VIN-) to the 50 %
level of the falling edge of the VO signal. Refer to Figure 53.
18. tPHL propagation delay is measured from the 50 % level on the rising edge of the input pulse (VIN+, VIN-) to the 50 %
level of the rising edge of the VO signal. Refer to Figure 53.
19. PWD is defined as | tPHL – tPLH | for any given device.
20. The difference between tPHL and tPLH between any two FOD8318 parts under same operating conditions, with equal
loads.
21. This is the amount of time the DESAT threshold must be exceeded before VO begins to go LOW. This is supply
voltage dependent. Refer to Figure 54.
©2010 Fairchild Semiconductor Corporation
FOD8318 Rev. 1.1.2
8
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