FOD8318 Datasheet, PDF (17/31 Pages) Fairchild Semiconductor – 2.5 A Output Current, IGBT Drive Optocoupler with Active Miller Clamp, Desaturation Detection, and Isolated Fault Sensing

Test Circuits (Continued)
0.1 μF
A
B
5V
+
–
FOD8318
1 V_IN+
V_E 16
2 V_IN–
V_LED2+ 15
3 V_DD1
DESAT 14
0.1 μF
V_E
+
–
4 GND1
V_DD2 13
3 kΩ
5 RESET
6 FAULT
7 V_LED1+
V_S 12
V_O 11
V_CLAMP 10
V_O
100 mA
pulsed
Switch A for V_OH test
8 V_LED1-*
V_SS 9
Switch B for V_OL test
*Pin 8 (V_LED1-) is internally connected to pin 4 (GND1).
100 mA
pulsed
B
A ^{0.1 μF}
30 V +
–
Figure 38. High Level (V_OH) and Low Level (V_OL) Output Voltage Test Circuit
0.1 μF
A
B
1 V_IN+
2 V_IN–
FOD8318
V_E 16
V_LED2+ 15
5V
+
–
3 V_DD1
I_DD1
4 GND1
DESAT 14
V_DD2 13
5 RESET
V_S 12
6 FAULT
V_O 11
7 V_LED1+
V_CLAMP 10
Switch A for I_DD1H test
8 V_LED1-*
V_SS 9
Switch B for I_DD1L test
*Pin 8 (V_LED1-) is internally connected to pin 4 (GND1).
Figure 39. High Level (I_DD1H) and Low Level (I_DD1L) Supply Current Test Circuit
0.1 μF
5V
+
–
A
B
FOD8318
1 V_IN+
V_E 16
2 V_IN–
V_LED2+ 15
3 V_DD1
DESAT 14
4 GND1
V_DD2 13
5 RESET
V_S 12
6 FAULT
V_O 11
I_E
I_DD2
I_S
V_O
0.1 μF
0.1 μF
7 V_LED1+
V_CLAMP 10
8 V_LED1-*
V_SS 9
Switch A for I_DD2H, I_SH and I_EH test
Switch B for I_DD2L, I_SL and I_EL test _{*Pin 8 (VLED1-) is internally connected to pin 4 (GND1).}
+
V_{E –}
30 V
+
–
Figure 40. High Level (I_DD2H), Low Level (I_DD2L) Output Supply Current,
High Level (I_SH), Low Level (I_SL) Source Current,
V_E High Level (I_EH), and V_E Low Level (I_EL) Supply Current Test Circuit
©2010 Fairchild Semiconductor Corporation
FOD8318 Rev. 1.1.2
17
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