FAN5182_08 Datasheet, PDF (6/19 Pages) Fairchild Semiconductor – Adjustable Output, 1-, 2-, or 3-Phase Synchronous Buck Controller

Electrical Characteristics (Continued)
VCC = 12V, FBRTN = GND, • indicates specifications over operating ambient temperature range.⁽²⁾
Symbol
Parameter
Conditions
Min. Typ. Max. Units
Current-Limit Comparator
VILIMIT(NM) Output Voltage: Normal Mode
VILIMIT(SD) Output Voltage: In Shutdown
IILIMIT(NM) Output Current: Normal Mode
Maximum Output Current
VCL Current Limit Threshold
Current Limit Setting Ratio
VDELAY(NM) Delay Normal Mode Voltage
VDELAY(OC) Delay Over-Current Threshold
tDELAY Latch-Off Delay Time⁽³⁾
Soft-Start
IDELAY(SS) Output Current, Soft-Start Mode
tDELAY(SS) Soft-Start Delay Time⁽³⁾
Enable Input
VIL(EN) Input Low Voltage
VIH(EN)
Input High Voltage
Input Hysteresis Voltage
IIN(EN) Input Current
Power-Good Comparator
VPWRGD(UV) Under-Voltage Threshold
VPWRGD(OV) Over-Voltage Threshold
VOL(PWRGD) Output Low Voltage
Power-Good Delay Time
VCROWBAR Crowbar Trip Point
Crowbar Reset Point
tCROWBAR Crowbar Delay Point⁽³⁾
PWM Outputs
VOL(PWM) Output Low Voltage
VOH(PWM) Output High Voltage
Supply
DC Supply Current
VUVLO
UVLO Threshold Voltage
UVLO Hysteresis
EN > 2.0V, RILIMIT = 250kΩ
•
EN < 0.8V, IILIMIT = -100µA
•
EN > 2.0V, RILIMIT = 250kΩ
•
VCSREF - VCSCOMP , RILIMIT = 250kΩ
VCL/IILIMIT
RDELAY = 250kΩ
RDELAY = 250kΩ
RDELAY = 250kΩ, CDELAY = 12nF
During Start-up Delay < 2.4V
•
RDELAY = 250kΩ, CDELAY = 12nF
•
•
•
Relative to FBRTN
•
Relative to FBRTN
•
IPWRGD(SINK) = 4mA
•
Relative to FBRTN
•
Relative to FBRTN
•
Over-voltage to PWM Going Low
IPWM(SINK) = 400µA
•
IPWM(SOURCE) = -400µA
•
•
VCC rising
•
•
2.9 3.0 3.1 V
400 mV
12
µA
60
µA
105 125 145 mV
10.4
mV/µA
2.9 3.0 3.1 V
1.7 1.8 1.9 V
1.5
ms
15 20 25 µA
500
µs
0.8 V
2.0
V
100
mV
-1
+1 µA
600 660 720 mV
880 940 1000 mV
225 400 mV
200
ns
0.970 1.050 1.105 V
550 650 750 mV
400
ns
160 500 mV
4.0
5
V
5 10 mA
6.5 6.9 7.3 V
0.7 0.9 1.1 V
Notes:
2. Limits at operating temperature extremes are guaranteed by design, characterization, and statistical quality control.
3. Guaranteed by design, not tested in production.
© 2005 Fairchild Semiconductor Corporation
FAN5182 • Rev. 1.1.3
6
www.fairchildsemi.com