FAN3100_09 Datasheet, PDF (5/21 Pages) Fairchild Semiconductor – Single 2A High-Speed, Low-Side Gate Driver

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device
reliability. The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Min.
Max. Unit
VDD
VIN
VOUT
VDD to PGND
Voltage on IN+ and IN- to GND, AGND, or PGND
Voltage on OUT to GND, AGND, or PGND
-0.3
20.0
V
GND - 0.3 VDD + 0.3 V
GND - 0.3 VDD + 0.3 V
TL Lead Soldering Temperature (10 seconds)
TJ Junction Temperature
-55
TSTG Storage Temperature
-65
ESD
Electrostatic Discharge
Protection Level
Human Body Model, JEDEC JESD22-A114
Charged Device Model, JEDEC JESD22-C101
4
750
+260 ºC
+150 ºC
+150 ºC
kV
V
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
VDD Supply Voltage Range
VIN Input Voltage IN+, IN-
TA Operating Ambient Temperature
Min.
4.5
0
-40
Max.
18.0
VDD
+125
Unit
V
V
ºC
© 2007 Fairchild Semiconductor Corporation
FAN3100 • Rev. 1.0.2
5
www.fairchildsemi.com