FAB2200 Datasheet, PDF (4/33 Pages) Fairchild Semiconductor – Audio Subsystem with Stereo Class-G Headphone Amplifier and 1.2W Mono Class-D Speaker Amplifier

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The Absolute Maximum Ratings are stress ratings only. All voltages are referenced to GND.
Symbol
V_BATT
V_IN
V_SGND
V_S
V_SP
V_BYP
Parameter
Voltage on VBATT Pin
Voltage on IN1, IN2, IN3, IN4, HPL, HPR Pins
Voltage on SGND Pin
Voltage on SDA, SCL, SDB Pins
Voltage on SPKRP, SPKRN Pins
Voltage on BYPIN1, BYPIN2, BYPOUT1, BYPOUT2 Pins
Duration of SPKRP, SPKRN Short Circuit to GND or VBATT
Duration of Short Circuit Between SPKRP and SPKRN
Duration of HPL, HPR Short Circuit to GND
Min.
-0.3
CPV_SS-0.3
-0.3
-0.3
-0.3
-0.3
Max.
6.0
CPV_DD+0.3
0.3
V_BATT+0.3
V_BATT+0.3
V_BATT+0.3
Continuous
Continuous
Continuous
Unit
V
V
V
V
V
V
Reliability Information
Symbol
T_J
T_STG
T_L
θ_JA
TSD
T_HYS
Parameter
Junction Temperature
Storage Temperature Range
Peak Reflow Temperature
Thermal Resistance, JEDEC Standard, Multilayer Test
Boards, Still Air
Thermal Shutdown Threshold
Thermal Shutdown Hysteresis
Min.
-65
Typ.
60
+150
+35
Max.
+150
+150
+300
Unit
°C
°C
°C
°C/W
°C
°C
ESD Protection
Symbol
Parameter
Condition
Min. Unit
HBM Human Body Model (HBM)
JESD22-A114-B Level 2,
EC61340-3-1: 2002 Level 2,
ESD-STM5.1-2001 Level 2,
MIL-STD-883E 3015.7 Level 2
3
kV
CDM Charged Device Model (CDM)
JESD22-C101-C Level III,
IEC61340-3-3 Level C4,
ESD-STM5.3.1-1999 Level C4
2
kV
Notes:
1. Device-use-level ESD tests are conducted at the connector pins.
2. External ESD suppressor ASIP protects the amplifier outputs. Suppressor is between amplifier and connector;
15Ω serial resistance + 5nF capacitor and Zener diodes (14V breakdown voltage) connected to the ground. In
addition, there is a ferrite bead in series between the suppressor and the connector.
3. The air discharge test can be ignored if the contact discharge test range is increased to the same voltages as air
discharge (contact discharge is more stable and repeatable test than air discharge).
© 2009 Fairchild Semiconductor Corporation
FAB2200 • Rev. 1.0.1
4
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