FOD8316 Datasheet, PDF (15/29 Pages) Fairchild Semiconductor – 2.5A Output Current, IGBT Drive Optocoupler

Test Circuits
5V
+
–
0.1μF
–
V_FAULT ⁺
I_FAULT
V_FAULT = 0.4V for I_FAULTL
V_FAULT = 5.0V for I_FAULTH
FOD8316
1 V_IN+
V_E 16
2 V_IN–
V_LED2+ 15
3 V_DD1
DESAT 14
4 GND1
V_DD2 13
5 RESET
V_S 12
6 FAULT
V_O 11
7 V_LED1+
V_SS 10
8 V_LED1-*
V_SS 9
A
0.1μF
10mA
Switch A closed for I_FAULTL
Switch A opened for I_FAULTH
*Pin 8 (V_LED1-) is internally connected to pin 4 (GND1).
Figure 32. Fault Output Current (I_FAULTL) and (I_FAULTH) Test Circuit
Pulse Gen
PW = 10μs
+
Period = 5ms –
0.1μF
5V
–
+
3kΩ
FOD8316
1 V_IN+
V_E 16
2 V_IN–
V_LED2+ 15
3 V_DD1
DESAT 14
4 GND1
V_DD2 13
5 RESET
V_S 12
6 FAULT
V_O 11
7 V_LED1+
V_SS 10
8 V_LED1-*
V_SS 9
0.1μF
+
–
V_E
0.1μF 47μF
0.1μF 47μF
+ ^VO
–
+
–
30V
*Pin 8 (V_LED1-) is internally connected to pin 4 (GND1).
Figure 33. High Level Output Current (I_OH) Test Circuit
Pulse Gen
PW = 4.99ms
Period = 5ms
+
–
0.1μF
5V
–
+
3kΩ
FOD8316
1 V_IN+
V_E 16
2 V_IN–
V_LED2+ 15
3 V_DD1
DESAT 14
0.1μF
+
–
V_E
4 GND1
V_DD2 13
5 RESET
6 FAULT
7 V_LED1+
V_S 12
V_O 11
V_SS 10
0.1μF 47μF
VO
+
–
+
–
30V
8 V_LED1-*
V_SS 9
0.1μF 47μF
*Pin 8 (V_LED1-) is internally connected to pin 4 (GND1).
Figure 34. Low Level Output Current (I_OL) Test Circuit
©2010 Fairchild Semiconductor Corporation
FOD8316 Rev. 1.2.0
15
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