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74F433 Datasheet, PDF (10/16 Pages) Fairchild Semiconductor – First-In First-Out (FIFO) Buffer Memory
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Absolute Maximum Ratings(Note 1)
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
VCC Pin Potential to
Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Standard Output
3-STATE Output
−0.5V to VCC
−0.5V to +5.5V
Current Applied to Output
in LOW State (Max)
twice the rated IOL (mA)
Recommended Operating
Conditions
Free Air Ambient Temperature
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Units
VCC
Conditions
VIH
Input HIGH Voltage
2.0
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
V
0.8
V
−1.5
V
Recognized as a HIGH Signal
Recognized as a LOW Signal
Min IIN = −18 mA
VOH
VOL
IIH
IBVI
ICEX
VID
IOD
IIL
IOZH
IOZL
IOS
ICC
Output HIGH
Voltage
Output LOW Voltage
Input HIGH Current
Input HIGH Current
Breakdown Test
10% VCC
2.4
10% VCC
2.4
5% VCC
2.7
5% VCC
2.7
10% VCC
IOH = 400 µA (ORE, IRF)
V
Min
IOH = 5.7 mA (Qn, Qs)
IOH = 400 µA (ORE, IRF)
IOH = 5.7 mA (Qn, Qs)
0.50
V
Min IOL = 16 mA (Qn, Qs)
5.0
µA
Max VIN = 2.7V
7.0
µA
Max
VIN = 7.0V
Output HIGH
Leakage Current
50
µA
Max
VOUT = VCC
Input Leakage
4.75
Test
V
0.0
IID = 1.9 µA
All Other Pins Grounded
Output Leakage
Circuit Current
3.75
µA
0.0
VIOD = 150 mV
All Other Pins Grounded
Input LOW Current
Output Leakage Current
Output Leakage Current
Output Short-Circuit Current
Power Supply Current
−0.4
mA
Max VIN = 0.5V
50
µA
Max VOUT = 2.7V (Qn, Qs)
−50
µA
Max VOUT = 0.5V (Qn, Qs)
−20
−130
mA
Max VOUT = 0V
150
215
mA
Max
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