EN29F800 Datasheet, PDF (25/38 Pages) List of Unclassifed Manufacturers – 8 Megabit (1024K x 8-bit / 512K x 16-bit) Flash Memory Boot Sector Flash Memory, CMOS 5.0 Volt-only

Table 8. AC CHARACTERISTICS
Read-only Operations Characteristics
EN29F800
Parameter
Symbols
JEDEC Standard
t_AVAV
t_RC
Description
Read Cycle Time
Test
Setup
Speed Options
-45 -55 -70 -90
Min 45 55 70 90
t_AVQV
t_ELQV
t_GLQV
t_ACC
t_CE
t_OE
Address to Output Delay
Chip Enable To Output Delay
CE = VIL ^{Max 45 55 70}
90
OE = VIL
OE = VIL ^{Max 45 55 70}
90
Output Enable to Output Delay
Max 25 30 30 35
t_EHQZ t_DF
Chip Enable to Output High Z
Max 20 20 20 20
t_GHQZ t_DF
Output Enable to Output High Z
Max 20 20 20 20
t_AXQX t_OH
Output Hold Time from
Addresses, CE or OE ,
whichever occurs first
Min
0
0
0
0
Notes:
For - 50
Vcc = 5.0V ± 5%
Output Load : 1 TTL gate and 30pF
Input Rise and Fall Times: 5ns
Input Rise Levels: 0.0 V to 3.0 V
Timing Measurement Reference Level, Input and Output: 1.5 V
For all others:
Vcc = 5.0V ± 10%
Output Load: 1 TTL gate and 100 pF
Input Rise and Fall Times: 20 ns
Input Pulse Levels: 0.45 V to 2.4 V
Timing Measurement Reference Level, Input and Output: 0.8 V and 2.0 V
Unit
ns
ns
ns
ns
ns
ns
ns
Addresses
CE#
OE#
WE#
Outputs
Reset#
RY/BY#
0V
tOEH
tRC
Addresses Stable
tACC
tDF
tOE
tCE
tOH
Output Valid
HIGH Z
Figure 5. AC Waveforms for READ Operations
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Rev. E, Issue Date: 2001/07/05
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