EN29F800 Datasheet, PDF (22/38 Pages) List of Unclassifed Manufacturers – 8 Megabit (1024K x 8-bit / 512K x 16-bit) Flash Memory Boot Sector Flash Memory, CMOS 5.0 Volt-only

Test Conditions
Device Under Test
CL
EN29F800
5.0 V
2.7 kΩ
6.2 kΩ
Note: Diodes are IN3064 or equivalent
Test Specifications
Test Conditions
Output Load
Output Load Capacitance, C_L
Input Rise and Fall times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
-45
-55
-70
-90
Unit
1 TTL Gate
30
30
100
100
pF
5
5
20
20
ns
0.0-0.3 0.0-0.3 0.45-2.4 0.45-2.4
V
1.5
1.5
0.8, 2.0 0.8, 2.0
V
1.5
1.5
0.8, 2.0 0.8, 2.0
V
4800 Great America Parkway, Suite 202
22
Santa Clara, CA 95054
Rev. E, Issue Date: 2001/07/05
Tel: [phone]
Fax: [phone]