4000S Datasheet, PDF (22/35 Pages) Cypress Semiconductor – 32-bit MCU Subsystem

PSoC^® 4: PSoC 4000S
Family Datasheet
Memory
Table 22. Flash DC Specifications
Spec ID
Parameter
SID173
V_PE
Description
Erase and program voltage
Min Typ
1.71
–
Max Units Details/Conditions
5.5
V
–
Table 23. Flash AC Specifications
Spec ID
Parameter
Description
Min Typ
SID174
T_ROWWRITE[9]
Row (block) write time (erase and
program)
–
–
SID175
T_ROWERASE[9]
Row erase time
–
–
SID176
T_{ROWPROGRAM[9]} Row program time after erase
–
–
SID178
T_BULKERASE[9]
Bulk erase time (32 KB)
–
–
SID180^[10] T_DEVPROG[9]
Total device program time
–
–
SID181^[10] F_END
Flash endurance
100 K –
SID182^[10] F_RET
Flash retention. T_A  55 °C, 100 K
P/E cycles
20
–
SID182A^[10]
–
Flash retention. T_A  85 °C, 10 K
P/E cycles
10
–
SID256
TWS48
Number of Wait states at 48 MHz 2
–
SID257
TWS24
Number of Wait states at 24 MHz 1
–
System Resources
Power-on Reset (POR)
Table 24. Power On Reset (PRES)
Spec ID
SID.CLK#6
SID185^[10]
SID186^[10]
Parameter
Description
SR_POWER_UP Power supply slew rate
V_RISEIPOR
V_FALLIPOR
Rising trip voltage
Falling trip voltage
Min Typ
1
–
0.80
–
0.70
–
Max Units Details/Conditions
20
Row (block) = 128 bytes
16
ms
–
4
–
35
–
7 Seconds
–
–
Cycles
–
–
–
Years
–
–
–
CPU execution from
Flash
–
CPU execution from
Flash
Max Units Details/Conditions
67
V/ms At power-up
1.5
V
–
1.4
–
Table 25. Brown-out Detect (BOD) for V_CCD
Spec ID
Parameter
Description
Min Typ Max Units Details/Conditions
SID190^[10] V_FALLPPOR
BOD trip voltage in active and
1.48
–
1.62
V
–
sleep modes
SID192^[10] V_FALLDPSLP
BOD trip voltage in Deep Sleep 1.11
–
1.5
–
Notes
9. It can take as much as 20 milliseconds to write to Flash. During this time the device should not be Reset, or Flash operations will be interrupted and cannot be relied
on to have completed. Reset sources include the XRES pin, software resets, CPU lockup states and privilege violations, improper power supply levels, and watchdogs.
Make certain that these are not inadvertently activated.
10. Guaranteed by characterization.
Document Number: 002-00123 Rev. *I
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