4000S Datasheet, PDF (12/35 Pages) Cypress Semiconductor – 32-bit MCU Subsystem

PSoC^® 4: PSoC 4000S
Family Datasheet
Electrical Specifications
Absolute Maximum Ratings
Table 2. Absolute Maximum Ratings^[1]
Spec ID#
Parameter
SID1
SID2
SID3
SID4
SID5
V_{DDD_ABS}
V_{CCD_ABS}
V_{GPIO_ABS}
I_{GPIO_ABS}
I_{GPIO_injection}
BID44
ESD_HBM
BID45
BID46
ESD_CDM
LU
Description
Digital supply relative to V_SS
Direct digital core voltage input relative
to V_SS
GPIO voltage
Maximum current per GPIO
GPIO injection current, Max for V_IH >
V_DDD, and Min for V_IL < V_SS
Electrostatic discharge human body
model
Electrostatic discharge charged device
model
Pin current for latch-up
Min
–0.5
–0.5
–0.5
–25
–0.5
2200
500
–140
Typ
Max
Units
Details/
Conditions
–
6
–
–
1.95
V
–
– V_DD+0.5
–
–
25
–
–
0.5
mA _{Current injected}
per pin
–
–
–
V
–
–
–
–
140
mA
–
Device Level Specifications
All specifications are valid for –40 °C  T_A  85 °C and T_J  100 °C, except where noted. Specifications are valid for 1.71 V to 5.5 V,
except where noted.
Table 3. DC Specifications
Typical values measured at V_DD = 3.3 V and 25 °C.
Spec ID#
SID53
Parameter
V_DD
Description
Power supply input voltage
SID255
V_DD
Power supply input voltage (V_CCD =
V_DD= V_DDA)
Min Typ
1.8
–
1.71
–
Max Units
Details/
Conditions
5.5
Internally
regulated supply
1.89
V
Internally
unregulated
supply
SID54
SID55
SID56
V_CCD
C_EFC
C_EXC
Output voltage (for core logic)
External regulator voltage bypass
Power supply bypass capacitor
–
1.8
–
–
0.1
–
–
1
–
–
X5R ceramic or
better
µF _{X5R ceramic or}
better
Active Mode, V_DD = 1.8 V to 5.5 V. Typical values measured at VDD = 3.3 V and 25 °C.
SID10
I_DD5
Execute from flash; CPU at 6 MHz
–
1.2
2.0
SID16
SID19
I_DD8
I_DD11
Execute from flash; CPU at 24 MHz
Execute from flash; CPU at 48 MHz
–
2.4
4.0
–
4.6
5.9
Sleep Mode, VDDD = 1.8 V to 5.5 V (Regulator on)
SID22
SID25
I_DD17
I_DD20
I²C wakeup WDT, and Comparators on –
I²C wakeup, WDT, and Comparators on –
1.1
1.6
1.4
1.9
–
mA
–
–
mA 6 MHz
12 MHz
Note
1. Usage above the absolute maximum conditions listed in Table 2 may cause permanent damage to the device. Exposure to Absolute Maximum conditions for extended
periods of time may affect device reliability. The Maximum Storage Temperature is 150 °C in compliance with JEDEC Standard JESD22-A103, High Temperature
Storage Life. When used below Absolute Maximum conditions but above normal operating conditions, the device may not operate to specification.
Document Number: 002-00123 Rev. *I
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