CM1231 Datasheet, PDF (1/11 Pages) California Micro Devices Corp – Two-Channel PicoGuard XPTM ESD Clamp Protection Array

Issue X-1
CM1231
Two-Channel PicoGuard XP^TM ESD Clamp Protection Array
Features
• Two channels of ESD protection
• Exceeds ESD protection to IEC61000-4-2 Level 4:
• ±12kV contact discharge (OUT pins)
• Two-stage matched clamp architecture
• Matching-of-series resistor (R) of ±10mΩ typical
• Flow-through routing for high-speed signal integrity
• Differential channel input capacitance matching of
0.02pF typical.
• Improved powered ASIC latchup protection
• Dramatic improvement in ESD protection vs. best
in class single-stage diode arrays
• 40% reduction in peak clamping voltage
• 40% reduction in peak residual current
• Withstands over 1000 ESD strikes*
• Available in a SOT23-6 package
Applications
• USB devices data port protection
• General high-speed data line ESD protection
Product Description
The CM1231 is a member of the XtremeESD^TM
product family and is specifically designed for next
generation deep submicron ASIC protection. These
devices are ideal for protecting systems with high data
and clock rates and for circuits requiring low capacitive
loading such as USB 2.0.
The CM1231 incorporates the PicoGuard XP^TM dual
stage ESD architecture which offers dramatically
higher system level ESD protection compared with
traditional single clamp designs. In addition, the
CM1231 provides a controlled filter roll-off for even
greater spurious EMI suppression and signal integrity.
The CM1231 protects against ESD pulses up to ±12kV
contact on the “OUT” pins per the IEC 61000-4-2
standard.
The device also features easily routed "pass-through"
differential pinouts in a 6-lead SOT23 package.
Electrical Schematic
VP
AOUT
Connector
BOUT
Positive Supply Rail
VP
VCC
CM1231
1Ω
AIN
Circuitry
Under
Protection
1Ω
BIN
VN
VN
Ground Rail
*Standard test condition is IEC61000-4-2 level 4 test circuit with each (A_OUT/B_OUT) pin subjected to ±12kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one
continuous test run.
© 2007 California Micro Devices Corp. All rights reserved.
12/17/07
490 N. McCarthy Blvd., Milpitas, CA 95035-5112 ● Tel: [phone] ● Fax: [phone] ● www.cmd.com 1