AZP53_13 Datasheet, PDF (9/13 Pages) Arizona Microtek, Inc – Low Phase Noise Sine Wave / CMOS to LVPECL Buffer / Translator

Arizona Microtek, Inc.
PERFORMANCE DATA
AZP53
Low Phase Noise Sine Wave/CMOS
to LVPECL Buffer/Translator
Table 4 - Absolute Maximum Ratings
Absolute Maximum Ratings are those values beyond which device life may be impaired.
Symbol
Characteristic
Rating
Unit
V_DD
Power Supply
0 to +5.5
V
V_I
Input Voltage
-0.5 to V_DD + 0.5
V
T_A
Operating Temperature Range
-40 to +85
°C
T_STG
Storage Temperature Range
-65 to +150
°C
ESD_HBM
Human Body Model
2500
V
ESD_MM
Machine Model
200
V
ESD_CDM
Charged Device Model
2500
V
Table 5 - DC Characteristics
DC Characteristics (V_DD = 3.0V to 3.6V unless otherwise specified, T_A = -40 to 85 °C)
Symbol
Characteristic
Conditions
Min Typ Max Unit
V_OH
Output HIGH Voltage¹
-40 C
25 C
85 C
2.05
V_DD = 3.3V
2.05
2.05
2.415
2.48 V
2.54
V_OL
Output LOW Voltage¹
-40 C
25 C
85 C
V_DD = 3.3V
1.365
1.43
1.49
1.615
1.68 V
1.74
I_Z Output Leakage Current, Tri-state²
EN=Disable
-10
10 μA
V_IH
High Level Input Voltage
V_IL
Low Level Input Voltage
I_PU
Pullup Current
I_PD
Pulldown Current
I_P
Pullup/Pulldown Current
EN_SEL
DIV_SEL
EN
EN_SEL
DIV_SEL
EN
2
V
0.8 V
2.2
μA
-2.2
μA
±2.2
μA
R_BIAS
Bias Resistor
D Input to Internal V_DD/2 Reference
10k
Ω
I_DD
Power Supply Current
Power Supply Current –
I_DDZ
Outputs Tri-state¹
D Input ≤ V_IL
EN=Disable
1 _{Specified with outputs terminated through 50Ω resistors to VDD - 2V or Thevenin equivalent.}
2 _{Measured at Q / Q pins.}
22 35 mA
8 mA
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Mar 2013, Rev 2.2