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AZT70 Datasheet, PDF (10/12 Pages) Arizona Microtek, Inc – Programmable Capacitive Tuning IC
Arizona Microtek, Inc.
AZT70
Programmable Capacitive Tuning IC
PERFORMANCE DATA
Table 6 – Absolute Maximum Ratings
Absolute Maximum Ratings are those values beyond which device life may be impaired.
Symbol
Characteristic
Rating
Unit
VDD
Power Supply
0 to +6.5
V
VI1
Input Voltage
-0.5 to VDD + 0.5
V
TA
Operating Temperature Range
-40 to +85
°C
TSTG
Storage Temperature Range
-65 to +150
°C
ESDHBM
Human Body Model
TBD
V
ESDMM
Machine Model
TBD
V
ESDCDM
Charged Device Model
TBD
V
1 PV Pin can exceed VDD by 1.2V during the programming interval
Table 7 – DC Characteristics
DC Characteristics (VDD = 2.375V to 5.5V unless otherwise specified, TA = -40 to 85 °C)
Symbol
Characteristic
Conditions
Min
CPV
Nominal capacitance variation across
process
-15
Typ Max Unit
+15 %
CVV
Capacitance variation across output
voltage
Voltage variation at X1 pin, 100MHz
±150 ppm/V
CTV
Capacitance variation across
temperature
100MHz - Zero Code
100MHz - Mid Code1
100MHz - Full Scale
325
40
ppm/°C
130
VIH
Input HIGH Voltage
DA, CLK
0.8 * VDD
V
VIL
Input LOW Voltage
DA, CLK
0.2 * VDD
V
RPD,D
Pull-down Resistor
DA
55k
Ω
RPD,CLK
Pull-down Resistor
CLK
75k
Ω
RPD,PV
Pull-down Resistor
PV
170k
Ω
VOH
Output High Voltage
PV Pin when reading EEPROM bits
VOL
Output Low Voltage
68kΩ pull-up resistor to VDD
0.6 * VDD
V
0.4
V
VPP
Programming Voltage (VDD=5.0V) PV pin when programming EEPROM
5.6
IDD
IDDPROG
tMEM
Tprog
Cyprog
Power Supply Current
Power Supply Current
EEPROM Data Retention
Programming Temperature
Programming Cycle
1 Bit4, Bit7 High
Normal Operation
Programming Mode
10
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+1-480-962-5881
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6.0
6.1 V
7.0
50 µA
20 µA
20
yrs
25
°C
k
May 2012, Rev 1.2