HCPL-3180-500E Datasheet, PDF (4/16 Pages) AVAGO TECHNOLOGIES LIMITED – 2.5 Amp Output Current, High Speed, Gate Drive Optocoupler

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Regulatory Information
t_p
T_p
T_L
T_smax
T_smin
260 +0/-5 °C
217 °C
RAMP-UP
3 °C/SEC. MAX.
150 - 200 °C
t_s
PREHEAT
t_L
60 to 180 SEC.
TIME WITHIN 5 °C of ACTUAL
PEAK TEMPERATURE
20-40 SEC.
The HCPL-3180 has been approved by the following
organizations:
IEC/EN/DIN EN 60747-5-2
RAMP-DOWN
6 °C/SEC. MAX.
60 to 150 SEC.
Approved under: IEC 60747-5-2:1997 + A1:2002
EN 60747-5-2:2001 + A1:2002
DIN EN 60747-5-2 (VDE 0884 Teil 2):2003-01
(Option 060 only)
UL
25
t 25 °C to PEAK
TIME
NOTES:
THE TIME FROM 25 °C to PEAK TEMPERATURE = 8 MINUTES MAX.
T_smax = 200 °C, T_smin = 150 °C
Note: Non-halide flux should be used.
Approval under UL 1577, component recognition
program up to V_ISO = 3750 Vrms. File E55361.
CSA
Approval under CSA Component Acceptance Notice #5,
File CA 88324.
IEC/EN/DIN EN 60747-5-2 Insulation Characteristics (HCPL-3180 Option 060)
Description
Symbol
HCPL-3180
Unit
Installation classification per DIN EN 0110 1997-04
for rated mains voltage ≤ 150 V_rms
I - IV
for rated mains voltage ≤ 300 V_rms
I - III
for rated mains voltage ≤ 600 V_rms
I-II
Climatic Classification
55/100/21
Pollution Degree (DIN EN 0110 1997-04)
2
Maximum Working Insulation Voltage
V_IORM
630
V_peak
Input to Output Test Voltage, Method b*
V_IORM x 1.875=V_PR, 100% Production Test with
t_m=1 sec, Partial Discharge < 5 pC
V_PR
1181
V_peak
Input to Output Test Voltage, Method a*
V_IORM x 1.5=V_PR, Type and Sample Test, t_m=60 sec,
Partial Discharge < 5 pC
V_PR
945
V_peak
Highest Allowable Overvoltage
V_IOTM
6000
(Transient Overvoltage t_ini = 10 sec)
V_peak
Safety-limiting values – maximum values allowed in the
event of a failure.
Case Temperature
Input Current**
Output Power**
T_S
175
°C
I_S,INPUT
230
mA
P_{S, OUTPUT}
600
mW
Insulation Resistance at T_S, V_IO = 500 V
R_S
>10⁹
Ω
* Refer to the optocoupler section of the Isolation and Control Components Designer’s Catalog, under Product Safety Regulations section IEC/
EN/DIN EN 60747-5-2 for a detailed description of Method a and Method b partial discharge test profiles.
** Refer to the following figure for dependence of P_S and I_S on ambient temperature.
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