SAM4CM_14 Datasheet, PDF (313/1177 Pages) ATMEL Corporation – Atmel | SMART ARM-based Flash MCU

13.5.2 Test Environment
Figure 13-4 shows a test environment example (JTAG Boundary scan). Test vectors are sent and interpreted by
the tester. In this example, the “board in test” is designed using a number of JTAG-compliant devices. These
devices can be connected to form a single scan chain.
Figure 13-4. Application Test Environment Example
Test Adaptor
Tester
JTAG
Probe
JTAG
Connector
Chip n
Chip 2
SAM4
Chip 1
SAM4-based Application Board In Test
13.6 Debug and Test Pin Description
Table 13-1. Debug and Test Signal List
Signal Name
Function
Reset/Test
NRST
Microcontroller Reset
TST
Test Select
SWD/JTAG
TCK/SWCLK
Test Clock/Serial Wire Clock
TDI
Test Data In
TDO/TRACESWO
Test Data Out/Trace
Asynchronous Data Out
TMS/SWDIO
Test Mode Select/Serial Wire
Input/Output
JTAGSEL
JTAG Selection
Type
Active Level
Input/Output
Low
Input
Input
Input
Output
Input
Input
High
SAM4CM Series [DATASHEET]
Atmel-11203C-ATARM-SAM4CM32-SAM4CM16-SAM4CM8-Datasheet_06-Oct-14
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