AMD29F010B Datasheet, PDF (22/34 Pages) Advanced Micro Devices – 1 Megabit (128 K x 8-bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory

TEST CONDITIONS
5.0 V
Device
Under
Test
C_L
6.2 kΩ
2.7 kΩ
Note: Diodes are IN3064 or equivalent
Figure 7. Test Setup
Table 6. Test Specifications
Test Condition
-45 All others Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
20
ns
Input Pulse Levels
0.0–3.0 0.45–2.4 V
Input timing measurement
reference levels
1.5
0.8
V
Output timing measurement
reference levels
1.5
2.0
V
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
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Am29F010B