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AMD29F010B Datasheet, PDF (20/34 Pages) Advanced Micro Devices – 1 Megabit (128 K x 8-bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory
DC CHARACTERISTICS
TTL/NMOS Compatible
Parameter
Symbol
Parameter Description
Test Description
ILI
Input Load Current
ILIT
A9 Input Load Current
ILO
Output Leakage Current
ICC1
VCC Active Read Current
(Notes 1, 2)
VIN = VSS to VCC, VCC = VCC Max
VCC = VCC Max, A9 = 12.5 V
VOUT = VSS to VCC, VCC = VCC Max
CE# = VIL, OE# = VIH
ICC2
VCC Active Write Current
(Notes 2, 3, 4)
CE# = VIL, OE# = VIH
ICC3
VCC Standby Current
CE# and OE# = VIH
VIL
Input Low Voltage
VIH
Input High Voltage
VID
Voltage for Autoselect and Sector
Protect
VCC = 5.0 V
VOL
VOH
VLKO
Output Low Voltage
Output High Voltage
Low VCC Lock-out Voltage
IOL = 12 mA, VCC = VCC Min
IOH = –2.5 mA, VCC = VCC Min
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH.
2. Maximum ICC specifications are tested with VCC=VCCmax.
3. ICC active while Embedded Program or Embedded Erase Algorithm is in progress.
4. Not 100% tested.
Min
–0.5
2.0
10.5
2.4
3.2
Typ
Max
Unit
±1.0
µA
50
µA
±1.0
µA
12
30
mA
30
40
mA
0.4
1.0
mA
0.8
V
VCC + 0.5 V
12.5
V
0.45
V
V
4.2
V
20
Am29F010B