ADATE305 Datasheet, PDF (16/56 Pages) Analog Devices – 250 MHz Dual Integrated DCL with Level Setting DACs, Per Pin PMU, and Per Chip VHH

ADATE305
Parameter
Current Force Settling Time to
0.1% of Final Value
Range A, 200 pF in Parallel
with 120 Ω
Range B, 200 pF in Parallel
with 1.5 kΩ
Range C, 200 pF in Parallel
with 15.0 kΩ
Range D, 200 pF in Parallel
with 150 kΩ
Range E, 200 pF in Parallel
with 1.5 MΩ
Current Force Settling Time to
1.0% of Final Value:
Range A, 200 pF in Parallel
with 120 Ω
Range B, 200 pF in Parallel
with 1.5 kΩ
Range C, 200 pF in Parallel
with 15.0 kΩ
Range D, 200 pF in Parallel
with 150 kΩ
Range E, 200 pF in Parallel
with 1.5 MΩ
INTERACTION AND CROSSTALK
Measure Voltage Channel-to-
Channel Crosstalk
Measure Current Channel-to-
Channel Crosstalk
Min Typ Max Unit
8.2
μs
9.4
μs
30
μs
281
μs
2668
μs
4.2
4.3
8.1
205
505
±0.125
±0.01
μs
μs
μs
μs
μs
%FSR
%FSR
Test
Level
S
Conditions/Comments
PMU enabled, FI, PE disabled, start with PMUDAC
programmed to 0 current, program PMUDAC to FS current
S
S
S
S
PMU enabled, FI, PE disabled, start with PMUDAC
programmed to 0 current, program PMUDAC to FS current
CB
CB
CB
CB
CB
CT
PMU enabled, FIMV, PE disabled, Range B, forcing 0 mA into
0 V load; other channel: Range A, forcing a step of 0 mA to 25 mA
into 0 V load; report ∆V of MEASOUT01 pin under test;
0.125% × 8.0 V = 10 mV
CT
PMU enabled, FVMI, PE disabled, Range E, forcing 0 V into
0 mA current load; other channel: Range E, forcing a step of 0 V
to 5 V into 0 mA current load; report ∆V of MEASOUT01 pin
under test; 0.01% × 5.0 V = 0.5 mV
EXTERNAL SENSE (PMUS_CHX)
Table 8.
Parameter
EXTERNAL SENSE (PMUS_CHX)
Voltage Range
Input Leakage Current
Min Typ
Max
−1.5
+6.0
−20
+20
Test
Unit Level Conditions/Comments
V
D
nA
P
Tested at −1.5 V and +6.0 V
DUTGND INPUT
Table 9.
Parameter
Min Typ
Max
DUTGND INPUT
Input Voltage Range, Referenced to GND −0.1
+0.1
Input Bias Current
1
100
Test
Unit Level Conditions/Comments
V
D
μA
P
Tested at −100 mV and +100 mV
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