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ADG636YRU-REEL Datasheet, PDF (13/16 Pages) Analog Devices – 1 pC Charge Injection, 100 pA Leakage, CMOS, ±5 V/+5 V/+3 V Dual SPDT Switch
TEST CIRCUITS
IDS
V1
S
D
VS
RON = V1/IDS
Figure 14. On Resistance
ADG636
IS (OFF)
S
A
VS
ID (OFF)
D
A
VD
Figure 15. Off Leakage
S
NC
ID (ON)
D
A
VD
NC = NO CONNECT
Figure 16. On Leakage
VDD
0.1µF
VSS
0.1µF
VDD
A1
VSS
S1A
VS1A
3V
ADDRESS
DRIVE (VIN) 0V
A0
VS
50Ω
S1B
VS1B
VOUT
50%
50%
90%
90%
2.4V
EN
GND
D1
RL
300Ω
VOUT
CL
35pF
tTRANSITION
tTRANSITION
Figure 17. Transition Time, tTRANSITION
VDD
0.1µF
VSS
0.1µF
VDD
A0
VSS
S1A
3V
ADDRESS
VS
DRIVE (VIN) 0V
A1
S1B
VS
50Ω
VOUT
80%
80%
2.4V
D1
VOUT
EN
RL
CL
GND
300Ω
35pF
tBBM
Figure 18. Break-Before-Make Delay, tBBM
VDD
0.1µF
VSS
0.1µF
VDD
A0
A1
VSS
S1A
S1B
3V
ENABLE
VS
DRIVE (VIN) 0V
VOUT
OUTPUT
EN
0V
VS
50Ω
D1
RL
VOUT
CL
GND
300Ω
35pF
50%
50%
90%
90%
tON (EN)
tOFF (EN)
Figure 19. Enable Delay, tON (EN), tOFF (EN)
Rev. B | Page 13 of 16