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SI5411EDU Datasheet, PDF (2/9 Pages) Vishay Siliconix – P-Channel 12 V (D-S) MOSFET
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Si5411EDU
Vishay Siliconix
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VGS(th) Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Currenta
Drain-Source On-State Resistancea
Forward Transconductancea
Dynamicb
VDS
VDS/TJ
VGS(th)/TJ
VGS(th)
IGSS
IDSS
ID(on)
RDS(on)
gfs
VGS = 0 V, ID = - 250 μA
ID = - 250 μA
VDS = VGS, ID = - 250 μA
VDS = 0 V, VGS = ± 8 V
VDS = 0 V, VGS = ± 4.5 V
VDS = - 12 V, VGS = 0 V
VDS = - 12 V, VGS = 0 V, TJ = 55 °C
VDS  - 5 V, VGS = - 4.5 V
VGS = - 4.5 V, ID = - 6 A
VGS = - 3.7 V, ID = - 5 A
VGS = - 2.5 V, ID = - 5 A
VGS = - 1.8 V, ID = - 2 A
VGS = - 6 V, ID = - 6 A
- 12
- 0.4
- 10
-5
1.8
0.0066
0.0073
0.0095
0.0155
45
- 0.9
±2
± 0.2
-1
- 10
0.0082
0.0094
0.0117
0.0206
V
mV/°C
V
μA
A

S
Input Capacitance
Ciss
4100
Output Capacitance
Coss
VDS = - 6 V, VGS = 0 V, f = 1 MHz
860
pF
Reverse Transfer Capacitance
Crss
870
Total Gate Charge
Gate-Source Charge
Qg
VDS = - 6 V, VGS = - 8 V, ID = - 15 A
Qgs
VDS = - 6 V, VGS = - 4.5 V, ID = - 15 A
70
105
43
65
nC
5.5
Gate-Drain Charge
Qgd
10.5
Gate Resistance
Rg
f = 1 MHz
0.7
3.6
7.2

Turn-On Delay Time
td(on)
30
60
Rise Time
Turn-Off Delay Time
tr
td(off)
VDD = - 6 V, RL = 0.6 
ID  - 10 A, VGEN = - 4.5 V, Rg = 1 
30
60
70
140
Fall Time
Turn-On Delay Time
tf
td(on)
35
70
ns
12
25
Rise Time
Turn-Off Delay Time
tr
td(off)
VDD = - 6 V, RL = 0.6 
ID  - 10 A, VGEN = - 8 V, Rg = 1 
5
10
80
160
Fall Time
tf
25
50
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulse Diode Forward Current (100 μs)
Body Diode Voltage
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
Reverse Recovery Rise Time
IS
TC = 25 °C
ISM
VSD
IS = - 10 A, VGS = 0 V
trr
Qrr
ta
IF = - 10 A, dI/dt = 100 A/μs, TJ = 25 °C
tb
- 25
A
- 140
- 0.8
- 1.2
V
45
90
ns
35
70
nC
17
ns
28
Notes
a. Pulse test; pulse width  300 μs, duty cycle  2 %.
b. Guaranteed by design, not subject to production testing.

Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
S13-1662-Rev. A, 29-Jul-13
2
Document Number: 62879
For technical questions, contact: pmostechsupport@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000