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SI4908DY Datasheet, PDF (2/7 Pages) Vishay Siliconix – Dual N-Channel 40-V (D-S) MOSFET
Si4908DY
Vishay Siliconix
New Product
SPECIFICATIONS (TJ = 25 _C UNLESS OTHERWISE NOTED)
Parameter
Symbol
Test Condition
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VGS(th) Temperature Coefficient
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Currentb
Drain-Source On-State Resistanceb
Forward Transconductanceb
Dynamica
VDS
DVDS/TJ
DVGS(th)/TJ
VGS(th)
IGSS
IDSS
ID(on)
rDS(on)
gfs
VGS = 0 V, ID = 250 mA
ID = 250 mA
ID = 250 mA
VDS = VGS, ID = 250 mA
VDS = 0 V, VGS = "16 V
VDS = 40 V, VGS = 0 V
VDS = 40 V, VGS = 0 V, TJ = 55 _C
VDS = 5 V, VGS = 10 V
VGS = 10 V, ID = 4.1 A
VGS = 4.5 V, ID = 3.8 A
VDS = 15 V, ID = 4.1 A
Min Typa Max Unit
40
40
V
–4.6
0.8
2.2
100
nA
1
mA
10
20
A
0.048 0.060
W
0.056 0.070
15
S
Input Capacitance
Ciss
355
Output Capacitance
Reverse Transfer Capacitance
Coss
Crss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Gate Resistance
Rg
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
td(on)
tr
td(off)
Fall Time
tf
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
td(on)
tr
td(off)
tf
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulse Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Reverse Recovery Fall Time
ta
Reverse Recovery Rise Time
tb
Notes
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width v 300 ms, duty cycle v 2 %.
N-Channel
VDS = 20 V, VGS = 0 V, f = 1 MHz
VDS = 20 V, VGS = 10 V, ID = 5 A
N-Channel
VDS = 20 V, VGS = 4.5 V, ID = 5 A
f = 1 MHz
N-Channel
VDD = 20 V, RL = 4 W
ID ^ 1 A, VGEN = 10 V, Rg = 1 W
N-Channel
VDD = 20 V, RL = 4 W
ID ^ 1 A, VGEN = 4.5 V, Rg = 1 W
TC = 25 _C
IS = 1.5 A
N-Channel
IF = 2 A, di/dt = 100 A/ms, TJ = 25 _C
50
pF
29
8
12
3.7
6
nC
1.1
1.4
3.4
5.2
W
8
13
20
30
23
35
27
42
ns
74
110
95
145
31
48
33
50
2.3
A
20
0.8
1.2
V
26
40
ns
26
40
nC
13
ns
13
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
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Document Number: 73698
S–60218—Rev. A, 20-Feb-06