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TC59LM913AMG-50 Datasheet, PDF (9/46 Pages) Toshiba Semiconductor – MOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC
TC59LM913AMG-50
AC CHARACTERISTICS AND OPERATING CONDITIONS (Notes: 1, 2) (continued)
SYMBOL
PARAMETER
tLZ
tHZ
tQSLZ
tQSHZ
tQPDH
tPDEX
tT
tFPDL
tREFI
tPAUSE
IRC
IRCD
IRAS
IRBD
Data-out Low Impedance Time from CLK
Data-out High Impedance Time from CLK
DQS-out Low Impedance Time from CLK
DQS-out High Impedance Time from CLK
Last output to PD High Hold Time
Power Down Exit Time
Input Transition Time
PD Low Input Window for Self-Refresh Entry
Auto-Refresh Average Interval
Pause Time after Power-up
Random Read/Write Cycle Time
(applicable to same bank)
RDA/WRA to LAL Command Input Delay
(applicable to same bank)
LAL to RDA/WRA Command Input Delay
(applicable to same bank)
Random Bank Access Delay
(applicable to other bank)
IRWD
IWRD
IRSC
IPD
IPDA
IPDV
LAL following RDA to WRA Delay
(applicable to other bank)
BL = 2
BL = 4
LAL following WRA to RDA Delay
(applicable to other bank)
Mode Register Set Cycle Time
CL = 3
PD Low to Inactive State of Input Buffer
PD High to Active State of Input Buffer
Power down mode valid from REF command
IREFC
ICKD
ILOCK
Auto-Refresh Cycle Time
REF Command to Clock Input Disable at Self-Refresh Entry
DLL Lock-on Time (applicable to RDA command)
MIN
−0.65

−0.65
−0.65
0
0.9
0.1
−0.5 × tCK
0.4
200
5
1
4
2
2
3
1
5


18
18
16
200
MAX

0.65

0.65


1
5
3.9


1






1
1




UNIT NOTES
3,6,8
3,7,8
3,6,8
3,7,8
ns
3
3
5
µs
cycle
Rev 1.1
2005-11-08 9/46