TC59LM913AMG-50 Datasheet, PDF (20/46 Pages) Toshiba Semiconductor – MOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC

MODE REGISTER TABLE
Regular Mode Register (Notes: 1)
ADDRESS
BA1^*1
BA0^*1
BA2, A13~A8
A7^*3
Register
0
0
0
TE
TC59LM913AMG-50
A6~A4
A3
A2~A0
CL
BT
BL
A7 TEST MODE (TE)
0
Regular (default)
1
Test Mode Entry
A3 BURST TYPE (BT)
0
Sequential
1
Interleave
A6 A5 A4 CAS LATENCY (CL)
0
0
×
0
1
0
0
1
1
Reserved^*2
Reserved^*2
Reserved^*2
1
0
0
1
0
1
1
1
0
1
1
1
4
Reserved^*2
Reserved^*2
Reserved^*2
A2 A1 A0 BURST LENGTH (BL)
0
0
0
Reserved^*2
0
0
1
2
0
1
0
4
0
1
1
1
×
×
Reserved^*2
Extended Mode Register (Notes: 4)
ADDRESS
Register
BA1^*4
BA0^*4
BA2,
A13~A12
A11
A10~A7
A6
A5~A2
A1
0
1
0
0
0
DIC
0
DIC
A0^*5
DS
A6 A1 OUTPUT DRIVE IMPEDANCE CONTROL (DIC)
00
Normal Output Driver
01
Strong Output Driver
10
11
Weaker Output Driver
Weakest Output Driver
A0 DLL SWITCH (DS)
0
DLL Enable
1
DLL Disable
Notes: 1.
2.
3.
4.
5.
Regular Mode Register is chosen using the combination of BA0 = 0 and BA1 = 0.
“Reserved” places in Regular Mode Register should not be set.
A7 in Regular Mode Register must be set to “0” (low state).
Because Test Mode is specific mode for supplier.
Extended Mode Register is chosen using the combination of BA0 = 1 and BA1 = 0.
A0 in Extended Mode Register must be set to "0" to enable DLL for normal operation.
Rev 1.1
2005-11-08 20/46