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TC55VBM316AFTN Datasheet, PDF (8/15 Pages) Toshiba Semiconductor – TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS
READ CYCLE (See Note 1)
Address
A0~A18 (Word Mode)
A-1~A18 (Byte Mode)
CE1
CE2
OE
UB , LB
DOUT
I/O1~16 (Word Mode)
I/O1~8 (Byte Mode)
Hi-Z
TC55VBM316AFTN/ASTN40,55
tRC
tACC
tOH
tCO1
tCO2
tOE
tOD
tBA
tODO
tBE
tOEE
tCOE
tBD
VALID DATA OUT
Hi-Z
WRITE CYCLE 1 (R/W CONTROLLED) (See Note 4)
Address
A0~A18 (Word Mode)
A-1~A18 (Byte Mode)
R/W
CE1
CE2
UB , LB
DOUT
I/O1~16 (Word Mode)
I/O1~8 (Byte Mode)
DIN
I/O1~16 (Word Mode)
I/O1~8 (Byte Mode)
tAS
(See Note 2)
(See Note 5)
tWC
tWP
tWR
tCW
tCW
tBW
tODW
tOEW
Hi-Z
tDS
tDH
VALID DATA IN
(See Note 3)
(See Note 5)
2002-08-05 8/15