TA1287PG Datasheet, PDF (11/24 Pages) Toshiba Semiconductor – BIPOLAR LINEAR INTEGRATED CIRCUIT SILICON MONOLITHIC

TEST CONDITION
NOTE
ITEM
SW₉
A₁
YUV Gain
B
(Through Mode)
A₂
RGB Gain
A
(Through Mode)
TA1287PG,TA1287FG
TEST CONDITION (UNLESS OTHERWISE SPECIFIED, V_CC = 9 V and Ta = 25 ± 3°C)
SW₁₀
SW MODE
SW₁₁
SW_16A
SW_16B
SW_16C
MEASURING METHOD
<Common test condition>
1) V_CC = 9 V and Ta = 25 ± 3°C.
2) ALL switch modes are B, unless otherwise
specified.
B
B
B
B
B
1) Input Signal 1 into pin 4
2) Supply DC 0 V to YS1 (pin 9), YS2 (pin 10), YS (pin
11).
3) Input Signal 2 (f₀ = 100 kHz, V₀ = 0.2 Vp-p) into
V-IN (pin 1, SW₁ = A).
4) Measure the amplitude of V-OUT at pin 13.
Calculate the gain. (GTRY)
5) Calculate gains of Y-IN to Y-OUT and U-IN to
U-OUT, in the same way as 3) to 4)
GTY : Y-IN (pin 2)
to Y-OUT (pin 14)
GTBY : U-IN (pin 3)
to U-OUT (pin 15)
A
A
B
B
B
1) Calculate gains against R, G and B, in the same
way as NOTE A₁.
GRR : SW₆ = A, R-IN (pin 6)
to V-OUT (pin 13)
GRG : SW₇ = A, R-IN (pin 7)
to Y-OUT (pin 14)
GRB : SW₈ = A, R-IN (pin 8)
to U-OUT (pin 15)
11
2004-08-03