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DS92LV1023E_14 Datasheet, PDF (8/21 Pages) Texas Instruments – 30-66 MHz 10 Bit Bus LVDS Serializer
DS92LV1023E
SNLS187B – MARCH 2005 – REVISED APRIL 2013
www.ti.com
Serializer Switching Characteristics
Over recommended operating supply and temperature ranges unless otherwise specified.
Parameter
Test Conditions
Min
Typ
Max Units
tLLHT
tLHLT
Bus LVDS Low-to-High
Transition Time
Bus LVDS High-to-Low Transition Time
RL = 27Ω
CL=10pF to GND
Figure 3
(1)
0.2
0.4
ns
0.25
0.4
ns
tDIS
tDIH
tHZD
tLZD
tZHD
tZLD
tSPW
tPLD
tSD
tDJIT
DIN (0-9) Setup to TCLK
DIN (0-9) Hold from TCLK
DO ± HIGH to
TRI-STATE Delay
DO ± LOW to TRI-STATE Delay
DO ± TRI-STATE to HIGH Delay
DO ± TRI-STATE to LOW Delay
SYNC Pulse Width
Serializer PLL Lock Time
Serializer Delay
Deterministic Jitter
RL = 27Ω,
CL=10pF to GND
Figure 5
RL = 27Ω,
CL=10pF to GND
Figure 6
(2)
RL = 27Ω
Figure 8
RL = 27Ω, Figure 9
RL = 27Ω,
CL=10pF to GND,
(3)
30 MHz
66 MHz
0
ns
4.0
ns
3
10
ns
3
10
ns
5
10
ns
6.5
10
ns
5*tTCP
ns
510*tTCP
513*tTCP
ns
tTCP+ 1.0 tTCP+ 2.0 tTCP+ 3.0 ns
-350
-45
190
ps
-200
-70
80
ps
tRJIT
Random Jitter
RL = 27Ω,
CL=10pF to GND
19
25
ps
(RMS)
(1) tLLHT and tLHLT specifications are Guranteed By Design (GBD) using statistical analysis.
(2) Because the Serializer is in TRI-STATE mode, the Deserializer will lose PLL lock and have to resynchronize before data transfer.
(3) tDJIT specifications are Guranteed By Design using statistical analysis.
AC Timing Diagrams and Test Circuits
Figure 2. “Worst Case” Serializer ICC Test Pattern
Figure 3. Serializer Bus LVDS Output Load and Transition Times
Figure 4. Serializer Input Clock Transition Time
8
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