TLC8044 Datasheet, PDF (7/32 Pages) Texas Instruments – 12-BIT ANALOG-TO-DIGITAL INTERFACE FOR CHARGE-COUPLED DEVICE IMAGE SENSORS FOR SCANNERS

TLC8044
12-BIT ANALOG-TO-DIGITAL INTERFACE FOR
CHARGE-COUPLED DEVICE IMAGE SENSORS FOR SCANNERS
SLAS128 – JUNE 1997
electrical characteristics, V_DD = 5 V, AGND = DGND = 0 V, T_A = full range (unless otherwise noted)
(continued)
12-bit ADC
PARAMETER
TEST CONDITIONS MIN TYP MAX UNIT
Resolution
12
Bits
Sampling rate
6 MSPS
Full-scale transition error voltage at xINP (see Note 2)
Single-ended mode,
VI(xINN) = 2.5 V,
DAC code = 000H
–100
100 mV
Zero-scale transition error voltage at xINP (see Note 3)
Single-ended mode,
VI(xINN) = 2.5 V,
DAC code = 000H
–100
100 mV
Full-scale transition error voltage, VI(xINP) – VI(xINN) (see Note 2)
Differential mode,
DAC code = 000H
–25
25 mV
Zero-scale transition error voltage, VI(xINP) – VI(xINN) (see Note 3)
Differential mode,
DAC code = 000H
–25
25 mV
Differential nonlinearity (DNL) (see Note 4)
1.5 LSB
Maximum number of missing codes
0
8 CODES
Integral nonlinearity (INL) (see Note 5)
±2
±5 LSB
NOTES:
2. The full-scale transition at xINP is the difference between the signal input voltage that causes the 4094 to 4095 transition and the
measured reference voltage Vref(RT).
3. The zero-scale transition at xINP is the difference between the signal input voltage that causes the 0 to 1 transition and the reference
voltage Vref(RB).
4. Differential nonlinearity (DNL) is the difference between the measured value between any two adjacent codes and the ideal 1 LSB
value.
5. Integral nonlinearity (INL) is the maximum deviation of the output from the ideal straight line between zero and the full-scale value.
switching characteristics
PARAMETER
tpd(D)
ten(PZE)
tdis(PEZ)
Propagation delay time, MCLK↓ to output valid
Enable time, output, OE↓ to data valid
Disable time, output, OE↑ to high impedance
MIN TYP MAX UNIT
50
75 ns
70
75 ns
70
25 ns
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