LM3S613 Datasheet, PDF (41/591 Pages) List of Unclassifed Manufacturers – Microcontroller

Stellaris^® LM3S613 Microcontroller
1.4.7.2
1.4.8
can be used to test the interconnections of assembled printed circuit boards and obtain manufacturing
information on the components. The JTAG Port also provides a means of accessing and controlling
design-for-test features such as I/O pin observation and control, scan testing, and debugging.
The JTAG port is composed of the standard five pins: TRST, TCK, TMS, TDI, and TDO. Data is
transmitted serially into the controller on TDI and out of the controller on TDO. The interpretation of
this data is dependent on the current state of the TAP controller. For detailed information on the
operation of the JTAG port and TAP controller, please refer to the IEEE Standard 1149.1-Test
Access Port and Boundary-Scan Architecture.
The Stellaris JTAG controller works with the ARM JTAG controller built into the Cortex-M3 core.
This is implemented by multiplexing the TDO outputs from both JTAG controllers. ARM JTAG
instructions select the ARM TDO output while Stellaris JTAG instructions select the Stellaris TDO
outputs. The multiplexer is controlled by the Stellaris JTAG controller, which has comprehensive
programming for the ARM, Stellaris, and unimplemented JTAG instructions.
System Control and Clocks (see page 153)
System control determines the overall operation of the device. It provides information about the
device, controls the clocking of the device and individual peripherals, and handles reset detection
and reporting.
Hardware Details
Details on the pins and package can be found in the following sections:
■ “Pin Diagram” on page 533
■ “Signal Tables” on page 534
■ “Operating Characteristics” on page 542
■ “Electrical Characteristics” on page 543
■ “Package Information” on page 582
July 14, 2014
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Texas Instruments-Production Data