TMS570LS1114_14 Datasheet, PDF (40/167 Pages) Texas Instruments – 16- and 32-Bit RISC Flash Microcontroller

TMS570LS1114
SPNS188A – OCTOBER 2012 – REVISED SEPTEMBER 2013
3 Device Operating Conditions
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3.1 Absolute Maximum Ratings Over Operating Free-Air Temperature Range, ⁽¹⁾
Supply voltage range:
Input voltage range:
V_CC ⁽²⁾
V_CCIO, V_CCP ⁽²⁾
V_CCAD
All input pins, with exception of ADC pins
ADC input pins
-0.3 V to 1.43 V
-0.3 V to 4.6 V
-0.3 V to 5.5 V
-0.3 V to 4.6 V
-0.3 V to 5.5 V
I_IK (V_I < 0 or V_I > V_CCIO)
All pins, except AD1IN[23:0]
±20 mA
Input clamp current:
I_IK (V_I < 0 or V_I > V_CCAD)
AD1IN[23:0]
±10 mA
Total
±40 mA
Operating free-air temperature range, T_A:
Operating junction temperature range, T_J:
Storage temperature range, T_stg
-40°C to 125°C
-40°C to 150°C
-65°C to 150°C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to their associated
grounds.
3.2 Device Recommended Operating Conditions⁽¹⁾
MIN
NOM
MAX UNIT
V_CC
V_CCPLL
V_CCIO
V_CCAD
V_CCP
V_SS
V_SSAD
V_ADREFHI
V_ADREFLO
V_SLEW
T_A
T_J
Digital logic supply voltage (Core)
PLL Supply Voltage
Digital logic supply voltage (I/O)
MibADC supply voltage
Flash pump supply voltage
Digital logic supply ground
MibADC supply ground
A-to-D high-voltage reference source
A-to-D low-voltage reference source
Maximum positive slew rate for V_CCIO, V_CCAD and V_CCP supplies
Operating free-air temperature
Operating junction temperature⁽²⁾
1.14
1.14
3
3
3
-0.1
V_SSAD
V_SSAD
-40
-40
1.2
1.32 V
1.2
1.32 V
3.3
3.6 V
5.25 V
3.3
3.6 V
0
V
0.1 V
V_CCAD
V_CCAD
1
V
V
V/µs
125 °C
150 °C
(1) All voltages are with respect to V_SS, except V_CCAD, which is with respect to V_SSAD
(2) Reliability data is based upon a temperature profile that is equivalent to 100,000 power-on hours at 105°C junction temperature.
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Device Operating Conditions
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