LMH6702QML_17 Datasheet, PDF (3/17 Pages) Texas Instruments – 1.7 GHz, Ultra Low Distortion, Wideband Op Amp

LMH6702QML
www.ti.com
SNOSAQ2E – JULY 2005 – REVISED MARCH 2013
LMH6702 Electrical Characteristics DC Parameters⁽¹⁾⁽²⁾
The following conditions apply, unless otherwise specified.
R_L = 100Ω, V_CC = ±5V_DC, A_V = +2 feedback resistor (R_F) = 250Ω, gain resistor (R_G) = 250Ω
Symbol
Parameter
Conditions
Notes
Min Max Unit
I_BN
I_BI
V_IO
I_CC
PSSR
Input Bias Current, Noninverting
Input Bias Current, Iverting
Input Offset Voltage
Supply Current, no load
Power Supply Rejection Ratio
R_L = ∞
-V_CC = -4.5V to -5.0V,
+V_CC = +4.5V to +5.0V
-15 +15
μA
-21 +21
μA
-30 +30
μA
-34 +34
μA
-4.5 +4.5
mV
-6.0 +6.0
mV
15
mA
45
dB
Sub-
groups
1, 2
3
1, 2
3
1, 3
2
1, 2, 3
1, 2, 3
(1) The algebraic convention, whereby the most negative value is a minimum and most positive is a maximum, is used in this table.
Negative cur rent shall be defined as convential current flow out of a device terminal.
(2) Pre and Post irradiation limits are identical to those listed under the DC parameter tables above. Post irradiation testing is conducted at
room temperature, +25°C, only. Testing is performed as specified in MIL-STD-883 Test Method 1019 Condition A. The ELDRS-Free part
is also tested per Test Method 1019 Conditions D.
LMH6702 Electrical Characteristics AC Parameters ⁽¹⁾⁽²⁾
The following conditions apply, unless otherwise specified.
R_L = 100Ω, V_CC = ±5V_DC, A_V = +2 feedback resistor (R_F) = 250Ω, gain resistor (R_G) = 250Ω
Symbol
Parameter
Conditions
Notes Min Max Unit
Sub-
groups
HD₃
GFPL
GFPH
GFRH
HD₂
3rd Harmonic Distortion
Gain Flatness Peaking
Gain Flatness Peaking
Gain Flatness Rolloff
2nd Harmonic Distortion
2V_PP at 20MHz
0.1MHz to 75MHz, V_O < 0.5V_PP
> 75MHz, V_O < 0.5V_PP
75MHz to 125MHz, V_O<0.5V_PP
2V_PP at 20MHz
-62
dBc
4
0.4
dB
4
2.0
dB
4
0.2
dB
4
-52
dBc
4
(1) The algebraic convention, whereby the most negative value is a minimum and most positive is a maximum, is used in this table.
Negative cur rent shall be defined as convential current flow out of a device terminal.
(2) These parameters are not post irradiation tested.
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