LMH6702QML_17 Datasheet, PDF (2/17 Pages) Texas Instruments – 1.7 GHz, Ultra Low Distortion, Wideband Op Amp

LMH6702QML
SNOSAQ2E – JULY 2005 – REVISED MARCH 2013
www.ti.com
Absolute Maximum Ratings⁽¹⁾
Supply Voltage (V_CC)
Common Mode Input Voltage (V_CM)
Power Dissipation (P_D) ⁽²⁾
Junction Temperature (T_J)
Lead Temperature (soldering, 10 seconds)
Storage Temperature Range
Thermal Resistance
θ_JA
CDIP (Still Air)
CDIP (500LF/Min Air Flow)
CLGA (Still Air)
CLGA (500LF/Min Air Flow)
θ_JC
CDIP
CLGA
Package Weight (Typical)
CDIP
CLGA
ESD Tolerance ⁽³⁾
±6.75V_DC
V^-to V⁺
1W
+175°C
+300°C
-65°C ≤ T_A ≤ +150°C
170°C/W
100°C/W
220°C/W
150°C/W
35°C/W
37°C/W
1078mg
227mg
1000V
(1) Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions for which the
device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions see the Electrical
Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade
when the device is not operated under the listed test conditions.
(2) The maximum power dissipation must be derated at elevated temperatures and is dictated by T_Jmax (maximum junction temperature),
θ_JA (package junction to ambient thermal resistance), and T_A (ambient temperature). The maximum allowable power dissipation at any
temperature is P_Dmax = (T_Jmax - T_A)/θ_JA or the number given in the Absolute Maximum Ratings, whichever is lower.
(3) Human body model, 1.5kΩ in series with 100pF.
Recommended Operating Conditions
Supply Voltage (V_CC)
Gain Range
Ambient Operating Temperature Range (T_A)
±5V_DC to ±6V_DC
±1 to ±10
-55°C to +125°C
Quality Conformance Inspection
MIL-STD-883, Method 5005, Group A
Subgroup
1
2
3
4
5
6
7
8A
8B
9
10
11
Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp ( C)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
2
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