DAC8551-Q1 Datasheet, PDF (3/28 Pages) Texas Instruments – Automotive 16-Bit, Ultralow-Glitch, Voltage-Output DAC

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5 Pin Configuration and Functions
DGK Package
8-Pin VSSOP
Top View
DAC8551-Q1
SLASEB8A – FEBRUARY 2016 – REVISED MARCH 2016
VDD
1
V
2
REF
VFB
3
VOUT
4
8
GND
7
D
IN
6
SCLK
5
SYNC
PIN
NAME
NO.
D_IN
7
GND
8
SCLK
6
SYNC
5
V_DD
1
V_FB
3
V_OUT
4
V_REF
2
Table 2. Pin Functions
TYPE
DESCRIPTION
I
GND
I
I
PWR
I
O
I
Serial data input. Data is clocked into the 24-bit input shift register on each falling edge of the serial clock
input. Schmitt-trigger logic input.
Ground reference point for all circuitry on the device
Serial clock input. Data can be transferred at rates up to 3 0MHz. Schmitt-trigger logic input.
Level-triggered control input (active-low). This is the frame synchronization signal for the input data. SYNC
going low enables the input shift register, and data is transferred in on the falling edges of the following
clocks. The DAC is updated following the 24th clock (unless SYNC is taken high before this edge, in which
case the rising edge of SYNC acts as an interrupt, and the write sequence is ignored by the DAC8551-Q1).
Schmitt-trigger logic input.
Power supply input, 3.2 V to 5.5 V.
Feedback connection for the output amplifier. For voltage output operation, tie to V_OUT externally.
Analog output voltage from DAC. The output amplifier has rail-to-rail operation.
Reference voltage input.
6 Specifications
6.1 Absolute Maximum Ratings
over operating ambient temperature range (unless otherwise noted)⁽¹⁾
MIN
MAX
UNIT
V_DD to GND
Digital input voltage to GND
V_OUT to GND
V_REF to GND
V_FB to GND
Junction temperature range, T_J max
Storage temperature, T_stg
D_IN, SCLK and SYNC
–0.3
6
V
–0.3
V_DD + 0.3
V
–0.3
V_DD + 0.3
V
–0.3
V_DD + 0.3
V
–0.3
V_DD + 0.3
V
–65
150
°C
–65
150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Copyright © 2016, Texas Instruments Incorporated
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