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CC2650_16 Datasheet, PDF (17/59 Pages) Texas Instruments – Multistandard Wireless MCU
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CC2650
SWRS158A – FEBRUARY 2015 – REVISED OCTOBER 2015
IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps) – RX (continued)
Measured on the TI CC2650EM-5XD reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
Symbol rate error tolerance
Difference between incoming symbol rate and the
internally generated symbol rate
>1000
RSSI dynamic range
100
RSSI accuracy
±4
UNIT
ppm
dB
dB
5.9 IEEE 802.15.4 (Offset Q-PSK DSSS, 250 kbps) – TX
Measured on the TI CC2650EM-5XD reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Output power, highest setting Delivered to a single-ended 50-Ω load through a balun
5
dBm
Output power, highest setting
Measured on CC2650EM-4XS, delivered to a single-
ended 50-Ω load
2
dBm
Output power, lowest setting Delivered to a single-ended 50-Ω load through a balun
–21
dBm
Error vector magnitude
At maximum output power
2%
f < 1 GHz, outside restricted bands
–43
Spurious emission conducted
measurement
f < 1 GHz, restricted bands ETSI
f < 1 GHz, restricted bands FCC
f > 1 GHz, including harmonics
–65
dBm
–76
–46
Suitable for systems targeting compliance with worldwide radio-frequency regulations ETSI EN 300 328
and EN 300 440 Class 2 (Europe), FCC CFR47 Part 15 (US), and ARIB STD-T66 (Japan)
5.10 24-MHz Crystal Oscillator (XOSC_HF)
Measured on the TI CC2650EM-5XD reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.(1)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ESR Equivalent series resistance
20
60
Ω
LM Motional inductance
CL Crystal load capacitance
Crystal frequency
Crystal frequency tolerance(2)
Start-up time(3)
Relates to load capacitance
(CL in Farads)
< 1.6 × 10–24 / CL2
5
9
24
–40
40
150
H
pF
MHz
ppm
µs
(1) Probing or otherwise stopping the XTAL while the DC-DC converter is enabled may cause permanent damage to the device.
(2) Includes initial tolerance of the crystal, drift over temperature, ageing and frequency pulling due to incorrect load capacitance. As per
Bluetooth and IEEE 802.15.4 specification.
(3) Kick-started based on a temperature and aging compensated RCOSC_HF using precharge injection.
5.11 32.768-kHz Crystal Oscillator (XOSC_LF)
Measured on the TI CC2650EM-5XD reference design with Tc = 25°C, VDDS = 3.0 V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Crystal frequency
32.768
kHz
Crystal frequency tolerance, Bluetooth low-
energy applications(1)
–500
500 ppm
ESR Equivalent series resistance
30
100
kΩ
CL Crystal load capacitance
6
12
pF
(1) Includes initial tolerance of the crystal, drift over temperature, ageing and frequency pulling due to incorrect load capacitance. As per
Bluetooth and IEEE 802.15.4 specification.
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Specifications
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