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BQ40Z50 Datasheet, PDF (17/30 Pages) Texas Instruments – 1-Series, 2-Series, 3-Series, and 4-Series Li-Ion Battery Pack Manager
bq40z50
www.ti.com
SLUSBS8 – DECEMBER 2013
Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC =
2.2 V to 26 V (unless otherwise noted)
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
tSCD1
SCD1 detection AFE PROTECTION CONTROL[SCDDx2] = 0
delay time
AFE PROTECTION CONTROL[SCDDx2] = 1
0
0
915
µs
1850
ΔtSCD1
SCD1 detection
delay time
program step
AFE PROTECTION CONTROL[SCDDx2] = 0
AFE PROTECTION CONTROL[SCDDx2] = 1
61
µs
121
tSCD2
SCD2 detection AFE PROTECTION CONTROL[SCDDx2] = 0
delay time
AFE PROTECTION CONTROL[SCDDx2] = 1
0
0
458
µs
915
ΔtSCD2
SCD2 detection
delay time
program step
AFE PROTECTION CONTROL[SCDDx2] = 0
AFE PROTECTION CONTROL[SCDDx2] = 1
30.5
µs
61
tDETECT
Current fault
detect time
VSRP – VSRN = VT – 3 mV for OCD, SCD1, and SC2,
VSRP – VSRN = VT + 3 mV for SCC
Current fault
tACC
delay time
Max delay setting
–10
accuracy
160
µs
10
%
SMBus
Typical values stated where TA = 25°C and VCC = 14.4 V, Min/Max values stated where TA = –40°C to 85°C and VCC =
2.2 V to 26 V (unless otherwise noted)
PARAMETER
TEST CONDITION
MIN
fSMB
SMBus operating
frequency
SLAVE mode, SMBC 50% duty cycle
10
fMAS
SMBus master clock
frequency
MASTER mode, no clock low slave extend
tBUF
Bus free time between start
and stop
4.7
tHD(START)
Hold time after (repeated)
start
4.0
tSU(START)
Repeated start setup time
4.7
tSU(STOP)
Stop setup time
4.0
tHD(DATA)
Data hold time
300
tSU(DATA)
Data setup time
250
tTIMEOUT
Error signal detect time
25
tLOW
Clock low period
4.7
tHIGH
Clock high period
4.0
tR
Clock rise time
10% to 90%
tF
Clock fall time
90% to 10%
tLOW(SEXT)
Cumulative clock low slave
extend time
tLOW(MEXT)
Cumulative clock low
master extend time
TYP
MAX
UNIT
100
kHz
51.2
kHz
µs
µs
µs
µs
ns
ns
35
ms
µs
50
µs
1000
ns
300
ns
25
ms
10
ms
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